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Hideo AKABA
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Suita-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Electric near-field probe, control system for same, and piezoelectr...
Patent number
9,891,338
Issue date
Feb 13, 2018
Osaka University
Hideo Akaba
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
LIQUID EXAMINATION DEVICE AND LIQUID EXAMINATION METHOD
Publication number
20170299507
Publication date
Oct 19, 2017
OSAKA UNIVERSITY
Hideo ITOZAKI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC NEAR-FIELD PROBE, CONTROL SYSTEM FOR SAME, AND PIEZOELECTR...
Publication number
20160047932
Publication date
Feb 18, 2016
OSAKA UNIVERSITY
Hideo AKABA
G01 - MEASURING TESTING