Hideo Akama

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Hachiojishi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device power supply and IC test apparatus
- Patent number 6,809,511
- Issue date Oct 26, 2004
- Agilent Technologies, Inc.
- Hideo Akama
- G01 - MEASURING TESTING
Information Patent Grant
Prober interface card for shortening the settling time
- Patent number 5,933,017
- Issue date Aug 3, 1999
- Hewlett-Packard Company
- Yoshiyuki Bessho
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the breakdown voltage of semicon...
- Patent number 5,285,151
- Issue date Feb 8, 1994
- Hewlett-Packard Company
- Hideo Akama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring hysteresis characteristics in a...
- Patent number 5,241,269
- Issue date Aug 31, 1993
- Hewlett-Packard Company
- Shigeo Kamiya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring trigger and latchback voltage of...
- Patent number 5,057,780
- Issue date Oct 15, 1991
- Hewlett-Packard Co.
- Hideo Akama
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed power supply for determining breakdown voltage
- Patent number 4,914,312
- Issue date Apr 3, 1990
- Hewlett-Packard Company
- Hideo Akama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus for measuring time variant device impedance
- Patent number 4,481,464
- Issue date Nov 6, 1984
- Hewlett-Packard Company
- Hitoshi Noguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device power supply and IC test apparatus
- Publication number 20020180478
- Publication date Dec 5, 2002
- AGILENT TECHNOLOGIES, INC.
- Hideo Akama
- G01 - MEASURING TESTING