Hideo Iwai

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Rotation axis fine adjustment apparatus
- Patent number 4,656,878
- Issue date Apr 14, 1987
- Tokyo Kogaku Kika Kabushiki Kaisha
- Hideo Iwai
- G02 - OPTICS
Information Patent Grant
Base board device for measuring instruments
- Patent number 4,277,171
- Issue date Jul 7, 1981
- Tokyo Kogaku Kakai Kabushiki Kaisha
- Yasuo Iwafune
- G01 - MEASURING TESTING