Hideo Iwai

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Chigasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Energy discriminating electron detector and scanning electron micro...
- Patent number 10,121,633
- Issue date Nov 6, 2018
- National Institute for Materials Science
- Takashi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray irradiation device and analysis device
- Patent number 9,080,947
- Issue date Jul 14, 2015
- National Institute for Materials Science
- Hiromichi Yamazui
- G01 - MEASURING TESTING
Information Patent Grant
Method of treating metal analysis sample and device thereof
- Patent number 6,726,739
- Issue date Apr 27, 2004
- JFE Steel Corporation
- Kenji Abiko
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENERGY DISCRIMINATING ELECTRON DETECTOR AND SCANNING ELECTRON MICRO...
- Publication number 20170301512
- Publication date Oct 19, 2017
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Takashi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE
- Publication number 20130016813
- Publication date Jan 17, 2013
- ULVAC-PHI, INC.
- Hiromichi Yamazui
- G01 - MEASURING TESTING
Information Patent Application
Method of treating metal analysis sample and device thereof
- Publication number 20030010633
- Publication date Jan 16, 2003
- Kenji Abiko
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatuses for pretreatment of metal samples
- Publication number 20020017459
- Publication date Feb 14, 2002
- Kawasaki Steel Corporation
- Hisao Yasuhara
- G01 - MEASURING TESTING