Hideo Kanda

Person

Omiya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Imaging lens and imaging apparatus provided with the same
- Patent number 9,625,681
- Issue date Apr 18, 2017
- FUJIFILM Corporation
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus
- Patent number 9,612,426
- Issue date Apr 4, 2017
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus equipped with the imaging lens
- Patent number 9,529,177
- Issue date Dec 27, 2016
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus equipped with the imaging lens
- Patent number 9,329,363
- Issue date May 3, 2016
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus equipped with the imaging lens
- Patent number 9,279,962
- Issue date Mar 8, 2016
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus including the imaging lens
- Patent number 9,279,957
- Issue date Mar 8, 2016
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus including the imaging lens
- Patent number 9,256,053
- Issue date Feb 9, 2016
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Optical wave interference measuring apparatus
- Patent number 8,059,278
- Issue date Nov 15, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Optical wave interference measuring apparatus
- Patent number 7,982,882
- Issue date Jul 19, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Speckle interferometer apparatus
- Patent number 7,092,104
- Issue date Aug 15, 2006
- Fujinon Corporation
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Grant
Spherical form measuring and analyzing method
- Patent number 6,912,055
- Issue date Jun 28, 2005
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Reference lens for interferometer and interferometer that uses it
- Patent number 6,798,585
- Issue date Sep 28, 2004
- Fuji Photo Optical Co., Ltd.
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Imaging optical system for oblique incidence interferometer
- Patent number 6,744,523
- Issue date Jun 1, 2004
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for oblique incidence interferometer and apparatus u...
- Patent number 6,643,026
- Issue date Nov 4, 2003
- Fuji Photo Optical Co., Ltd.
- Hideo Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for oblique incidence interferometer and apparatus u...
- Patent number 6,570,661
- Issue date May 27, 2003
- Fuji Photo Optical Co., Ltd.
- Hideo Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Imaging lens for interferometric device
- Patent number 6,297,916
- Issue date Oct 2, 2001
- Fuji Photo Optical Co., Ltd.
- Hideo Kanda
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGING LENS AND IMAGING APPARATUS PROVIDED WITH THE SAME
- Publication number 20160011406
- Publication date Jan 14, 2016
- FUJIFILM CORPORATION
- NOBORU KOIZUMI
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS EQUIPPED WITH THE IMAGING LENS
- Publication number 20150226939
- Publication date Aug 13, 2015
- FUJIFILM CORPORATION
- Hideo KANDA
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS EQUIPPED WITH THE IMAGING LENS
- Publication number 20150177495
- Publication date Jun 25, 2015
- FUJIFILM CORPORATION
- Hideo KANDA
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS EQUIPPED WITH THE IMAGING LENS
- Publication number 20150177492
- Publication date Jun 25, 2015
- FUJIFILM CORPORATION
- Hideo KANDA
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS
- Publication number 20150160443
- Publication date Jun 11, 2015
- FUJIFILM CORPORATION
- Hideo KANDA
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS INCLUDING THE IMAGING LENS
- Publication number 20140293452
- Publication date Oct 2, 2014
- FUJIFILM CORPORATION
- HIDEO KANDA
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS INCLUDING THE IMAGING LENS
- Publication number 20140293448
- Publication date Oct 2, 2014
- FUJIFILM CORPORATION
- Hideo KANDA
- G02 - OPTICS
Information Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS
- Publication number 20110304856
- Publication date Dec 15, 2011
- FUJIFILM CORPORATION
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING SURFACE MISALIGNMENT AND ANGULAR MISALIGNMENT
- Publication number 20110304855
- Publication date Dec 15, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE
- Publication number 20100231923
- Publication date Sep 16, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
- Publication number 20100097619
- Publication date Apr 22, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
- Publication number 20100091299
- Publication date Apr 15, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CRYSTAL SEALING APPARATUS
- Publication number 20100033831
- Publication date Feb 11, 2010
- Hidenori TAKAHASHI
- G02 - OPTICS
Information Patent Application
Speckle interferometer apparatus
- Publication number 20040179204
- Publication date Sep 16, 2004
- Fuji Photo Optical Co., Ltd.
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Application
Spherical form measuring and analyzing method
- Publication number 20030184763
- Publication date Oct 2, 2003
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Reference lens for interferometer and interferometer that uses it
- Publication number 20030147152
- Publication date Aug 7, 2003
- Hideo Kanda
- G02 - OPTICS
Information Patent Application
Imaging optical system for oblique incidence interferometer
- Publication number 20020140944
- Publication date Oct 3, 2002
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Optical system for oblique incidence interferometer and apparatus u...
- Publication number 20010017697
- Publication date Aug 30, 2001
- Fuji photo optical Co., Ltd.
- Hideo Kanda
- G01 - MEASURING TESTING
Information Patent Application
Optical system for oblique incidence interferometer and apparatus u...
- Publication number 20010007502
- Publication date Jul 12, 2001
- Hideo Kanda
- G01 - MEASURING TESTING

Hideo Kanda

Person

Patents Grantslast 30 patents

Imaging lens and imaging apparatus provided with the same

Imaging lens and imaging apparatus

Imaging lens and imaging apparatus equipped with the imaging lens

Imaging lens and imaging apparatus equipped with the imaging lens

Imaging lens and imaging apparatus equipped with the imaging lens

Imaging lens and imaging apparatus including the imaging lens

Imaging lens and imaging apparatus including the imaging lens

Optical wave interference measuring apparatus

Optical wave interference measuring apparatus

Speckle interferometer apparatus

Spherical form measuring and analyzing method

Reference lens for interferometer and interferometer that uses it

Imaging optical system for oblique incidence interferometer

Optical system for oblique incidence interferometer and apparatus u...

Optical system for oblique incidence interferometer and apparatus u...

Imaging lens for interferometric device

Patents Applicationslast 30 patents

IMAGING LENS AND IMAGING APPARATUS PROVIDED WITH THE SAME

IMAGING LENS AND IMAGING APPARATUS EQUIPPED WITH THE IMAGING LENS

IMAGING LENS AND IMAGING APPARATUS EQUIPPED WITH THE IMAGING LENS

IMAGING LENS AND IMAGING APPARATUS EQUIPPED WITH THE IMAGING LENS

IMAGING LENS AND IMAGING APPARATUS

IMAGING LENS AND IMAGING APPARATUS INCLUDING THE IMAGING LENS

IMAGING LENS AND IMAGING APPARATUS INCLUDING THE IMAGING LENS

LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS

APPARATUS FOR MEASURING SURFACE MISALIGNMENT AND ANGULAR MISALIGNMENT

THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE

OPTICAL WAVE INTERFERENCE MEASURING APPARATUS

OPTICAL WAVE INTERFERENCE MEASURING APPARATUS

LIQUID CRYSTAL SEALING APPARATUS

Speckle interferometer apparatus

Spherical form measuring and analyzing method

Reference lens for interferometer and interferometer that uses it

Imaging optical system for oblique incidence interferometer

Optical system for oblique incidence interferometer and apparatus u...

Optical system for oblique incidence interferometer and apparatus u...