Hideo KASHIMA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Multistage-connected multipole, multistage multipole unit, and char...
- Patent number 11,769,650
- Issue date Sep 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideto Dohi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasonic CT device
- Patent number 10,945,684
- Issue date Mar 16, 2021
- Hitachi, Ltd.
- Yushi Tsubota
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Substance-testing apparatus, substance-testing system, and substanc...
- Patent number 10,048,172
- Issue date Aug 14, 2018
- Hitachi, Ltd.
- Masakazu Sugaya
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle detection device and security gate
- Patent number 9,850,696
- Issue date Dec 26, 2017
- Hitachi, Ltd.
- Masakazu Sugaya
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Sample holder, charged particle beam apparatus, and observation method
- Patent number 9,773,640
- Issue date Sep 26, 2017
- Hitachi, Ltd.
- Tomokazu Shimakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Attached matter testing device and testing method
- Patent number 9,696,288
- Issue date Jul 4, 2017
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzing device
- Patent number 9,423,388
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Koichi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer for substance
- Patent number 9,417,163
- Issue date Aug 16, 2016
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Aberration corrector and charged particle beam apparatus using the...
- Patent number 9,287,084
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Attached matter inspection device
- Patent number 9,261,437
- Issue date Feb 16, 2016
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,214,324
- Issue date Dec 15, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,040,905
- Issue date May 26, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam microscope, sample holder for charged particl...
- Patent number 8,963,102
- Issue date Feb 24, 2015
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cooling air intake structure for V-belt drive continuously variable...
- Patent number 8,840,496
- Issue date Sep 23, 2014
- Honda Motor Co., Ltd.
- Teruhide Yamanishi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,796,651
- Issue date Aug 5, 2014
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 8,618,520
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Adhering matter inspection equipment and method for inspecting adhe...
- Patent number 8,586,916
- Issue date Nov 19, 2013
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing a microsample
- Patent number 8,222,618
- Issue date Jul 17, 2012
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Adhering matter inspection equipment and method for inspecting adhe...
- Patent number 8,217,339
- Issue date Jul 10, 2012
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,897,936
- Issue date Mar 1, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,888,639
- Issue date Feb 15, 2011
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,550,750
- Issue date Jun 23, 2009
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,470,918
- Issue date Dec 30, 2008
- Hitachi Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,465,945
- Issue date Dec 16, 2008
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,268,356
- Issue date Sep 11, 2007
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,205,560
- Issue date Apr 17, 2007
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,205,554
- Issue date Apr 17, 2007
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Mass spectrometric apparatus and ion source
- Patent number 7,164,124
- Issue date Jan 16, 2007
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 6,927,391
- Issue date Aug 9, 2005
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting dangerous substances and substan...
- Patent number 6,884,997
- Issue date Apr 26, 2005
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220199356
- Publication date Jun 23, 2022
- HITACHI HIGH-TECH CORPORATION
- Tomonori NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multistage-Connected Multipole, Multistage Multipole Unit, and Char...
- Publication number 20220037113
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Hideto DOHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRASONIC CT DEVICE
- Publication number 20190290223
- Publication date Sep 26, 2019
- Hitachi, Ltd.
- Yushi TSUBOTA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Substance-Testing Apparatus, Substance-Testing System, and Substanc...
- Publication number 20170102296
- Publication date Apr 13, 2017
- Hitachi, Ltd
- Masakazu SUGAYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER, CHARGED PARTICLE BEAM APPARATUS, AND OBSERVATION METHOD
- Publication number 20160035535
- Publication date Feb 4, 2016
- Hitachi, Ltd.
- Tomokazu SHIMAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Analyzing Device
- Publication number 20150377851
- Publication date Dec 31, 2015
- Hitachi, Ltd
- Koichi TERADA
- G01 - MEASURING TESTING
Information Patent Application
ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE...
- Publication number 20150248944
- Publication date Sep 3, 2015
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ATTACHED MATTER INSPECTION DEVICE
- Publication number 20150233796
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hideo KASHIMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20150235831
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microparticle Detection Device and Security Gate
- Publication number 20150136975
- Publication date May 21, 2015
- Hitachi, Ltd
- Masakazu Sugaya
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...
- Publication number 20140353500
- Publication date Dec 4, 2014
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZER FOR SUBSTANCE
- Publication number 20140260542
- Publication date Sep 18, 2014
- Hitachi, Ltd
- Hisashi NAGANO
- G01 - MEASURING TESTING
Information Patent Application
ATTACHED MATTER TESTING DEVICE AND TESTING METHOD
- Publication number 20140238106
- Publication date Aug 28, 2014
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20140151543
- Publication date Jun 5, 2014
- Hitachi, Ltd
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Application
COOLING AIR INTAKE STRUCTURE FOR V-BELT DRIVE CONTINUOUSLY VARIABLE...
- Publication number 20120289370
- Publication date Nov 15, 2012
- Honda Motor Co., Ltd.
- Teruhide Yamanishi
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE
- Publication number 20120273692
- Publication date Nov 1, 2012
- Hitachi, Ltd
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ADHERING MATTER INSPECTION EQUIPMENT AND METHOD FOR INSPECTING ADHE...
- Publication number 20110278469
- Publication date Nov 17, 2011
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE
- Publication number 20110174974
- Publication date Jul 21, 2011
- Hitachi, Ltd
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20110114476
- Publication date May 19, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Adhering Matter Inspection Equipment and Method for Inspecting Adhe...
- Publication number 20090200458
- Publication date Aug 13, 2009
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20080191151
- Publication date Aug 14, 2008
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20080067385
- Publication date Mar 20, 2008
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20070181831
- Publication date Aug 9, 2007
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20070158564
- Publication date Jul 12, 2007
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20070158591
- Publication date Jul 12, 2007
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Mineral water feeding apparatus
- Publication number 20060070936
- Publication date Apr 6, 2006
- Isao Kato
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20050211927
- Publication date Sep 29, 2005
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Mass spectrometric apparatus and ion source
- Publication number 20050199799
- Publication date Sep 15, 2005
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20050199828
- Publication date Sep 15, 2005
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20050006600
- Publication date Jan 13, 2005
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Hideo KASHIMA

Person

Patents Grantslast 30 patents

Multistage-connected multipole, multistage multipole unit, and char...

Ultrasonic CT device

Substance-testing apparatus, substance-testing system, and substanc...

Microparticle detection device and security gate

Sample holder, charged particle beam apparatus, and observation method

Attached matter testing device and testing method

Particle analyzing device

Analyzer for substance

Aberration corrector and charged particle beam apparatus using the...

Attached matter inspection device

Analysis device and analysis method

Analysis device and analysis method

Charged particle beam microscope, sample holder for charged particl...

Cooling air intake structure for V-belt drive continuously variable...

Method and apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Adhering matter inspection equipment and method for inspecting adhe...

Method and apparatus for processing a microsample

Adhering matter inspection equipment and method for inspecting adhe...

Method and apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Mass spectrometric apparatus and ion source

Method and apparatus for processing a micro sample

Method and apparatus for detecting dangerous substances and substan...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS

Multistage-Connected Multipole, Multistage Multipole Unit, and Char...

ULTRASONIC CT DEVICE

Substance-Testing Apparatus, Substance-Testing System, and Substanc...

SAMPLE HOLDER, CHARGED PARTICLE BEAM APPARATUS, AND OBSERVATION METHOD

Particle Analyzing Device

ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE...

ATTACHED MATTER INSPECTION DEVICE

ANALYSIS DEVICE AND ANALYSIS METHOD

Microparticle Detection Device and Security Gate

CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...

ANALYZER FOR SUBSTANCE

ATTACHED MATTER TESTING DEVICE AND TESTING METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

COOLING AIR INTAKE STRUCTURE FOR V-BELT DRIVE CONTINUOUSLY VARIABLE...

METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE

ADHERING MATTER INSPECTION EQUIPMENT AND METHOD FOR INSPECTING ADHE...

METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE

Method and apparatus for specimen fabrication

Adhering Matter Inspection Equipment and Method for Inspecting Adhe...

Method and apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Mineral water feeding apparatus

Method and apparatus for processing a micro sample

Mass spectrometric apparatus and ion source

Method and apparatus for processing a micro sample

Method and apparatus for specimen fabrication