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Hideo Kotajima
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Noncontact surface shape measuring method and apparatus thereof
Patent number
8,570,532
Issue date
Oct 29, 2013
Mitaka Kohki Co., Ltd.
Katsuhiro Miura
G01 - MEASURING TESTING
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Patent Grant
Non-contact surface configuration measuring apparatus and method th...
Patent number
7,209,242
Issue date
Apr 24, 2007
Mitaka Kohki Co., Ltd.
Katsushige Nakamura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
NONCONTACT SURFACE SHAPE MEASURING METHOD AND APPARATUS THEREOF
Publication number
20110279826
Publication date
Nov 17, 2011
Mitaka Kohki Co., Ltd.
Katsuhiro Miura
G01 - MEASURING TESTING
Information
Patent Application
Non-contact surface configuration measuring apparatus and method th...
Publication number
20050151978
Publication date
Jul 14, 2005
Katsushige Nakamura
G02 - OPTICS