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Hideo Mitsuhashi
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Log analysis system, log analysis method, log analysis program, and...
Patent number
11,574,211
Issue date
Feb 7, 2023
NEC Corporation
Hideo Mitsuhashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Input device, input method, and program
Patent number
9,958,902
Issue date
May 1, 2018
NEC Corporation
Shin Norieda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Input device, input method and medium
Patent number
9,377,850
Issue date
Jun 28, 2016
NEC Corporation
Shin Norieda
G01 - MEASURING TESTING
Information
Patent Grant
Information presentation device using tactile stimulus with vibrator
Patent number
9,278,705
Issue date
Mar 8, 2016
NEC Corporation
Kazuhito Murata
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Input device, method and medium
Patent number
9,195,303
Issue date
Nov 24, 2015
NEC Corporation
Shin Norieda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Portable terminal
Patent number
8,253,648
Issue date
Aug 28, 2012
NEC Corporation
Michio Nagai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Folding electric device having perpendicular and horizontal shafts
Patent number
7,493,150
Issue date
Feb 17, 2009
NEC Corporation
Yosuke Watanabe
E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information
Patent Grant
Portable information terminal
Patent number
6,922,190
Issue date
Jul 26, 2005
NEC Corporation
Yukio Yamaguti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Working process end point real time determination method
Patent number
6,490,497
Issue date
Dec 3, 2002
NEC Corporation
Hideo Mitsuhashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for inspecting connection state of electronic part and a sub...
Patent number
6,428,202
Issue date
Aug 6, 2002
NEC Corporation
Hideo Mitsuhashi
G01 - MEASURING TESTING
Information
Patent Grant
Polishing process monitoring method and apparatus, its endpoint det...
Patent number
6,425,801
Issue date
Jul 30, 2002
NEC Corporation
Akira Takeishi
B24 - GRINDING POLISHING
Information
Patent Grant
Wafer polishing apparatus and polishing method
Patent number
6,168,684
Issue date
Jan 2, 2001
NEC Corporation
Hideo Mitsuhashi
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
LOG ANALYSIS SYSTEM, LOG ANALYSIS METHOD, LOG ANALYSIS PROGRAM, AND...
Publication number
20200210865
Publication date
Jul 2, 2020
NEC Corporation
Hideo MITSUHASHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INPUT DEVICE, INPUT METHOD, AND PROGRAM
Publication number
20130009870
Publication date
Jan 10, 2013
NEC Corporation
Shin Norieda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INPUT DEVICE, INPUT METHOD AND MEDIUM
Publication number
20130013229
Publication date
Jan 10, 2013
NEC Corporation
Shin Norieda
G01 - MEASURING TESTING
Information
Patent Application
INPUT DEVICE, METHOD AND MEDIUM
Publication number
20130002544
Publication date
Jan 3, 2013
NEC Corporation
Shin Norieda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PRESENTATION DEVICE USING TACTILE STIMULUS WITH VIBRATOR
Publication number
20120242465
Publication date
Sep 27, 2012
NEC Corporation
Kazuhito Murata
B60 - VEHICLES IN GENERAL
Information
Patent Application
INFORMATION INPUT SYSTEM, METHOD FOR INPUTTING INFORMATION AND INFO...
Publication number
20110134082
Publication date
Jun 9, 2011
Hideo Mitsuhashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PORTABLE TERMINAL
Publication number
20090079664
Publication date
Mar 26, 2009
NEC Corporation
Michio Nagai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Folding electric device having perpendicular and horizontal shafts
Publication number
20040192422
Publication date
Sep 30, 2004
NEC Corporation
Yosuke Watanabe
E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information
Patent Application
Portable information terminal
Publication number
20030186719
Publication date
Oct 2, 2003
NEC Corporation
Yukio Yamaguti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor wafer polishing end point detection method and apparatus
Publication number
20020013007
Publication date
Jan 31, 2002
NEC Corporation
Koichi Hasegawa
B24 - GRINDING POLISHING
Information
Patent Application
Semiconductor wafer polishing endpoint detecting system and method...
Publication number
20010036676
Publication date
Nov 1, 2001
NEC Corporation
Hideo Mitsuhashi
B24 - GRINDING POLISHING