Hideo Monma

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Kawasaki, JP

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Patents Grantslast 30 patents

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Semiconductor device having a test circuit
- Patent number 4,833,395
- Issue date May 23, 1989
- Fujitsu Limited
- Takeshi Sasaki
- G01 - MEASURING TESTING
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Chip on chip type integrated circuit device
- Patent number 4,703,483
- Issue date Oct 27, 1987
- Fujitsu Limited
- Yoshinori Enomoto
- G01 - MEASURING TESTING
Information Patent Grant
Gate array
- Patent number 4,692,783
- Issue date Sep 8, 1987
- Fujitsu Limited
- Hideo Monma
- H01 - BASIC ELECTRIC ELEMENTS
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Integrated circuit with frequency-dividing circuits capable of bein...
- Patent number 4,422,038
- Issue date Dec 20, 1983
- Fujitsu Limited
- Hideo Monma
- G04 - HOROLOGY
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Quick feeding system for a counter
- Patent number 4,280,213
- Issue date Jul 21, 1981
- Fujitsu Limited
- Masayuki Takahashi
- G04 - HOROLOGY