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Hideo MORISHITA

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRON MICROSCOPE
    • Publication number 20240128049
    • Publication date Apr 18, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Katsura TAKAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
    • Publication number 20240120168
    • Publication date Apr 11, 2024
    • Hitachi High-Tech Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
    • Publication number 20230402246
    • Publication date Dec 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM APPLICATION DEVICE
    • Publication number 20230335367
    • Publication date Oct 19, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takashi OHSHIMA
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20230274907
    • Publication date Aug 31, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Teruo KOHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON MICROSCOPE
    • Publication number 20220406558
    • Publication date Dec 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20220246393
    • Publication date Aug 4, 2022
    • Hitachi High-Tech Corporation
    • Teruo Kohashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM APPARATUS
    • Publication number 20220165536
    • Publication date May 26, 2022
    • Hitachi High-Tech Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20220068593
    • Publication date Mar 3, 2022
    • Hitachi High-Tech Corporation
    • Hideo Morishita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM APPLICATION DEVICE
    • Publication number 20210319970
    • Publication date Oct 14, 2021
    • Hitachi High-Tech Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SPIN POLARIMETER
    • Publication number 20210074509
    • Publication date Mar 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELE...
    • Publication number 20200402762
    • Publication date Dec 24, 2020
    • Hitachi High-Tech Corporation
    • Teruo Kohashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20200273665
    • Publication date Aug 27, 2020
    • Hitachi High-Technologies Corporation
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20200090903
    • Publication date Mar 19, 2020
    • Hitachi High-Technologies Corporation
    • Ryo HIRANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    COMPOSITE CHARGED PARTICLE BEAM DEVICE
    • Publication number 20180025885
    • Publication date Jan 25, 2018
    • Hitachi High-Technologies Corporation
    • Yuta IMAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE AND ELECTRON TRAJECTORY ADJUSTMENT MET...
    • Publication number 20170263415
    • Publication date Sep 14, 2017
    • Hitachi, Ltd
    • Daisuke BIZEN
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD
    • Publication number 20170069458
    • Publication date Mar 9, 2017
    • Hitachi High-Technologies Corporation
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning Electron Microscope
    • Publication number 20160148782
    • Publication date May 26, 2016
    • Hitachi High-Technologies Corporation
    • Toshihide AGEMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...
    • Publication number 20160104597
    • Publication date Apr 14, 2016
    • Hitachi High-Technologies Corporation
    • Yuta IMAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device, Sample Observation Method, Sample Pla...
    • Publication number 20160025659
    • Publication date Jan 28, 2016
    • Hitachi High-Technologies Corporation
    • Yusuke OMINAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20140361167
    • Publication date Dec 11, 2014
    • Hitachi High-Technologies Corporation
    • Hideo Morishita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron Beam Apparatus
    • Publication number 20130146766
    • Publication date Jun 13, 2013
    • Hitachi High-Technologies Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20120298864
    • Publication date Nov 29, 2012
    • Hideo Morishita
    • H01 - BASIC ELECTRIC ELEMENTS