Hideo NAKAJIMA

Person

Nagaokakyo-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning type probe microscope and control device for scanning type...
- Patent number 11,454,647
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,641,790
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning-type probe microscope
- Patent number 8,181,267
- Issue date May 15, 2012
- Shimadzu Corporation
- Kanji Kobayashi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM
- Publication number 20240418746
- Publication date Dec 19, 2024
- SHIMADZU CORPORATION
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND PROGRAM
- Publication number 20240402215
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...
- Publication number 20220358636
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...
- Publication number 20210311091
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190324053
- Publication date Oct 24, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Scanning-type Probe Microscope
- Publication number 20110307979
- Publication date Dec 15, 2011
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING

Hideo NAKAJIMA

Person

Patents Grantslast 30 patents

Scanning type probe microscope and control device for scanning type...

Scanning probe microscope

Scanning probe microscope and light intensity adjusting method

Scanning-type probe microscope

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM

SCANNING PROBE MICROSCOPE AND PROGRAM

PROBE ASSESSMENT METHOD AND SPM

ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...

SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD

SCANNING PROBE MICROSCOPE

Scanning-type Probe Microscope