Hideo Ota

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Hachioji, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect classification device, inspection device, and inspection system
- Patent number 11,442,024
- Issue date Sep 13, 2022
- Hitachi High-Technologies Corporation
- Takanori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus and an inspecting method
- Patent number 8,831,899
- Issue date Sep 9, 2014
- Hitachi High-Technologies Corporation
- Kazunori Nemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Silver halide photographic material with improved antistatic proper...
- Patent number 5,137,802
- Issue date Aug 11, 1992
- Konishiroku Photo Industry Co., Ltd.
- Eiichi Ueda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Silver halide photographic material having improved antistatic and...
- Patent number 4,956,270
- Issue date Sep 11, 1990
- Konishiroku Photo Industry Co., Ltd.
- Noriki Tachibana
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Silver halide photographic light-sensitive material
- Patent number 4,499,179
- Issue date Feb 12, 1985
- Konishiroku Photo Industry Co., Ltd.
- Hideo Ota
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Defect Classification Device, Inspection Device, and Inspection System
- Publication number 20200256807
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Takanori KONDO
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE WAFER FOR CALIBRATION OF DARK-FIELD INSPECTION APPARATUS,...
- Publication number 20110276299
- Publication date Nov 10, 2011
- Kazunori Nemoto
- G01 - MEASURING TESTING