Hideo Sakagawa

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Nirasaki-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probing method and prober for measuring electrical characteristics...
- Patent number 7,417,445
- Issue date Aug 26, 2008
- Tokyo Electron Limited
- Hideo Sakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Probing method and prober
- Patent number 6,906,542
- Issue date Jun 14, 2005
- Tokyo Electron Limited
- Hideo Sakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe device and method of controlling the same
- Patent number 5,034,684
- Issue date Jul 23, 1991
- Tokyo Electron Limited
- Kazuo Mitsui
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probing method and prober
- Publication number 20050168232
- Publication date Aug 4, 2005
- Hideo Sakagawa
- G01 - MEASURING TESTING
Information Patent Application
Probing method and prober
- Publication number 20040140820
- Publication date Jul 22, 2004
- TOKYO ELECTRON LIMITED
- Hideo Sakagawa
- G01 - MEASURING TESTING