Hideo Sakai

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Facility state determination device, facility state determination m...
- Patent number 10,908,595
- Issue date Feb 2, 2021
- Hitachi, Ltd.
- Yuichi Sakurai
- G05 - CONTROLLING REGULATING
Information Patent Grant
State identification device, state identification method and mechan...
- Patent number 10,845,794
- Issue date Nov 24, 2020
- Hitachi, Ltd.
- Hideo Sakai
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Pattern measurement method and pattern measurement device
- Patent number 10,184,790
- Issue date Jan 22, 2019
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Control device, charged particle beam apparatus, program and method...
- Patent number 9,934,940
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a glass substrate for a magnetic disk and m...
- Patent number 9,299,382
- Issue date Mar 29, 2016
- Hoya Corporation
- Hideo Sakai
- B24 - GRINDING POLISHING
Information Patent Grant
Method of manufacturing a glass substrate for a magnetic disk and m...
- Patent number 9,186,771
- Issue date Nov 17, 2015
- Hoya Corporation
- Hideo Sakai
- B24 - GRINDING POLISHING
Information Patent Grant
Method of manufacturing a glass substrate for a magnetic disk and m...
- Patent number 9,183,868
- Issue date Nov 10, 2015
- Hoya Corporation
- Hideo Sakai
- B24 - GRINDING POLISHING
Information Patent Grant
Edge flaw detection device
- Patent number 7,616,300
- Issue date Nov 10, 2009
- Raytex Corporation
- Naoyuki Nohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FACILITY STATE DETERMINATION DEVICE, FACILITY STATE DETERMINATION M...
- Publication number 20190384268
- Publication date Dec 19, 2019
- Hitachi, Ltd.
- Yuichi SAKURAI
- G05 - CONTROLLING REGULATING
Information Patent Application
STATE IDENTIFICATION DEVICE, STATE IDENTIFICATION METHOD AND MECHAN...
- Publication number 20190324428
- Publication date Oct 24, 2019
- Hitachi, Ltd
- Hideo SAKAI
- G05 - CONTROLLING REGULATING
Information Patent Application
CONTROL DEVICE, CHARGED PARTICLE BEAM APPARATUS, PROGRAM AND METHOD...
- Publication number 20170278673
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT DEVICE
- Publication number 20170138725
- Publication date May 18, 2017
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A GLASS SUBSTRATE FOR A MAGNETIC DISK AND M...
- Publication number 20120251711
- Publication date Oct 4, 2012
- HOYA CORPORATION
- Hideo SAKAI
- B08 - CLEANING
Information Patent Application
METHOD OF MANUFACTURING A GLASS SUBSTRATE FOR A MAGNETIC DISK AND M...
- Publication number 20120196033
- Publication date Aug 2, 2012
- HOYA CORPORATION
- Hideo SAKAI
- B24 - GRINDING POLISHING
Information Patent Application
Edge flaw detection device
- Publication number 20090091748
- Publication date Apr 9, 2009
- Naoyuki Nohara
- G01 - MEASURING TESTING
Information Patent Application
Edge flaw detection device
- Publication number 20090091747
- Publication date Apr 9, 2009
- Naoyuki Nohara
- G01 - MEASURING TESTING

Hideo Sakai

Person

Patents Grantslast 30 patents

Facility state determination device, facility state determination m...

State identification device, state identification method and mechan...

Pattern measurement method and pattern measurement device

Control device, charged particle beam apparatus, program and method...

Method of manufacturing a glass substrate for a magnetic disk and m...

Method of manufacturing a glass substrate for a magnetic disk and m...

Method of manufacturing a glass substrate for a magnetic disk and m...

Edge flaw detection device

Patents Applicationslast 30 patents

FACILITY STATE DETERMINATION DEVICE, FACILITY STATE DETERMINATION M...

STATE IDENTIFICATION DEVICE, STATE IDENTIFICATION METHOD AND MECHAN...

CONTROL DEVICE, CHARGED PARTICLE BEAM APPARATUS, PROGRAM AND METHOD...

PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT DEVICE

METHOD OF MANUFACTURING A GLASS SUBSTRATE FOR A MAGNETIC DISK AND M...

METHOD OF MANUFACTURING A GLASS SUBSTRATE FOR A MAGNETIC DISK AND M...

Edge flaw detection device

Edge flaw detection device