Hideo Sakata

Person

  • Oomiya, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Coordinate measuring instrument

    • Patent number 4,630,381
    • Issue date Dec 23, 1986
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Clamp device in measuring instrument

    • Patent number 4,567,660
    • Issue date Feb 4, 1986
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Coordinate measuring instrument

    • Patent number 4,567,672
    • Issue date Feb 4, 1986
    • Mitutoyo Mfg. Co., Ltd.
    • Masataka Honda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument

    • Patent number 4,561,185
    • Issue date Dec 31, 1985
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Two-directional touch sensor

    • Patent number 4,561,190
    • Issue date Dec 31, 1985
    • Mitutoyo Mfg. Co., Ltd.
    • Takeshi Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument

    • Patent number 4,551,919
    • Issue date Nov 12, 1985
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital indication type measuring machine

    • Patent number 4,536,963
    • Issue date Aug 27, 1985
    • Mitutoyo Mfg. Co., Ltd.
    • Takeshi Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radially adjustable internal grinder

    • Patent number 4,507,895
    • Issue date Apr 2, 1985
    • Mitutoyo Mfg. Co. Ltd.
    • Hideo Sakata
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Touch signal probe

    • Patent number 4,496,807
    • Issue date Jan 29, 1985
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Coordinate measuring instrument

    • Patent number 4,495,703
    • Issue date Jan 29, 1985
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Touch signal probe

    • Patent number 4,488,019
    • Issue date Dec 11, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer gauge

    • Patent number 4,485,556
    • Issue date Dec 4, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Height gauge

    • Patent number 4,458,423
    • Issue date Jul 10, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Grant

    Micrometer

    • Patent number D274413
    • Issue date Jun 26, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer

    • Patent number D273664
    • Issue date May 1, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring instrument

    • Patent number 4,442,607
    • Issue date Apr 17, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inner diameter measuring instrument

    • Patent number 4,438,566
    • Issue date Mar 27, 1984
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Instrument for measuring a length

    • Patent number 4,420,887
    • Issue date Dec 20, 1983
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring device

    • Patent number 4,389,783
    • Issue date Jun 28, 1983
    • Kabushiki Kaisha Mitutoya Seisakusho
    • Hideo Sakata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contour measuring instrument

    • Patent number 4,389,786
    • Issue date Jun 28, 1983
    • Mitutoyo Mfg. Co., Ltd.
    • Hideo Sakata
    • G01 - MEASURING TESTING