Hideo TAKIZAWA

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,486,693
- Issue date Nov 1, 2022
- Lasertec Corporation
- Ko Gondaira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 9,544,558
- Issue date Jan 10, 2017
- Lasertec Corporation
- Koyo Tada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Focus control method for an optical apparatus which inspects a phot...
- Patent number 7,692,128
- Issue date Apr 6, 2010
- Lasertec Corporation
- Hideo Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Phase shift amount measurement apparatus and transmittance measurem...
- Patent number 7,643,157
- Issue date Jan 5, 2010
- Lasertec Corporation
- Hideo Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Laser length measuring instrument
- Patent number 5,123,742
- Issue date Jun 23, 1992
- Hitachi Electronics Engineering Co., Ltd.
- Hideo Takizawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20200041251
- Publication date Feb 6, 2020
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20150304616
- Publication date Oct 22, 2015
- Lasertec Corporation
- Koyo TADA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Phase shift amount measurement apparatus and transmittance measurem...
- Publication number 20080174786
- Publication date Jul 24, 2008
- Hideo Takizawa
- G01 - MEASURING TESTING
Information Patent Application
Focus control method
- Publication number 20080142681
- Publication date Jun 19, 2008
- Hideo Takizawa
- G02 - OPTICS