Hideo Toraya

Person

Tachikawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
- Patent number 12,287,300
- Issue date Apr 29, 2025
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analyzing diffraction pattern of mixture, and...
- Patent number 12,031,927
- Issue date Jul 9, 2024
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Degree-of-crystallinity measurement apparatus, degree-of-crystallin...
- Patent number 11,852,597
- Issue date Dec 26, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 11,841,334
- Issue date Dec 12, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase analysis device for analyzing non-crystalline ph...
- Patent number 11,402,341
- Issue date Aug 2, 2022
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 10,962,489
- Issue date Mar 30, 2021
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for x-ray diffraction
- Patent number 9,417,195
- Issue date Aug 16, 2016
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
X-ray stress measuring apparatus
- Patent number 9,146,203
- Issue date Sep 29, 2015
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method and X-ray diffraction apparatus
- Patent number 8,340,248
- Issue date Dec 25, 2012
- Rigaku Corporation
- Hideo Toraya
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray diffraction apparatus and X-ray diffraction method
- Patent number 7,801,272
- Issue date Sep 21, 2010
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Method of estimating preferred orientation of polycrystalline material
- Patent number 6,873,681
- Issue date Mar 29, 2005
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20240167969
- Publication date May 23, 2024
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
- Publication number 20230280290
- Publication date Sep 7, 2023
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20220390392
- Publication date Dec 8, 2022
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYZING DIFFRACTIONPATTERN OF MIXTURE, AND...
- Publication number 20220187225
- Publication date Jun 16, 2022
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
Quantitative Phase Analysis Device For Analyzing Non-Crystalline Ph...
- Publication number 20210018452
- Publication date Jan 21, 2021
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE PHASE ANALYSIS DEVICE, QUANTITATIVE PHASE ANALYSIS MET...
- Publication number 20200173938
- Publication date Jun 4, 2020
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE QUANTITATIVE PHASE ANALYSIS DEVICE, CRYSTALLINE QUANTIT...
- Publication number 20180364183
- Publication date Dec 20, 2018
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ITS APPARATUS FOR X-RAY DIFFRACTION
- Publication number 20130129052
- Publication date May 23, 2013
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Application
X-RAY STRESS MEASURING APPARATUS
- Publication number 20130121470
- Publication date May 16, 2013
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS
- Publication number 20100246768
- Publication date Sep 30, 2010
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION METHOD
- Publication number 20090086921
- Publication date Apr 2, 2009
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
Method of estimating preferred orientation of polycrystalline material
- Publication number 20030235270
- Publication date Dec 25, 2003
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING

Hideo Toraya

Person

Patents Grantslast 30 patents

Device and method for analyzing diffraction pattern of mixture, and...

Method and device for analyzing diffraction pattern of mixture, and...

Degree-of-crystallinity measurement apparatus, degree-of-crystallin...

Quantitative phase analysis device, quantitative phase analysis met...

Quantitative phase analysis device for analyzing non-crystalline ph...

Quantitative phase analysis device, quantitative phase analysis met...

Method and its apparatus for x-ray diffraction

X-ray stress measuring apparatus

X-ray diffraction method and X-ray diffraction apparatus

X-ray diffraction apparatus and X-ray diffraction method

Method of estimating preferred orientation of polycrystalline material

Patents Applicationslast 30 patents

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

METHOD AND DEVICE FOR ANALYZING DIFFRACTIONPATTERN OF MIXTURE, AND...

Quantitative Phase Analysis Device For Analyzing Non-Crystalline Ph...

QUANTITATIVE PHASE ANALYSIS DEVICE, QUANTITATIVE PHASE ANALYSIS MET...

CRYSTALLINE QUANTITATIVE PHASE ANALYSIS DEVICE, CRYSTALLINE QUANTIT...

METHOD AND ITS APPARATUS FOR X-RAY DIFFRACTION

X-RAY STRESS MEASURING APPARATUS

X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION METHOD

Method of estimating preferred orientation of polycrystalline material