Hideo Tsuchiya

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Communication system and communication method
- Patent number 11,805,098
- Issue date Oct 31, 2023
- Nippon Telegraph and Telephone Corporation
- Shinya Kawano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Load distribution system and load distribution method
- Patent number 11,757,779
- Issue date Sep 12, 2023
- Nippon Telegraph and Telephone Corporation
- Akihiro Kimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Load distribution system and load distribution method
- Patent number 11,632,331
- Issue date Apr 18, 2023
- Nippon Telegraph and Telephone Corporation
- Akihiro Kimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Management device and management method
- Patent number 11,463,515
- Issue date Oct 4, 2022
- Nippon Telegraph and Telephone Corporation
- Katsuma Miyamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Notification device and notification method
- Patent number 11,394,571
- Issue date Jul 19, 2022
- Nippon Telegraph and Telephone Corporation
- Shunsuke Homma
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Function management apparatus, function management method and commu...
- Patent number 11,388,019
- Issue date Jul 12, 2022
- Nippon Telegraph and Telephone Corporation
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Communication apparatus, communication method and program
- Patent number 11,343,223
- Issue date May 24, 2022
- Nippon Telegraph and Telephone Corporation
- Katsuma Miyamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Load distribution system and load distribution method
- Patent number 11,128,569
- Issue date Sep 21, 2021
- Nippon Telegraph and Telephone Corporation
- Akihiro Kimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 11,004,193
- Issue date May 11, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 10,984,525
- Issue date Apr 20, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 10,846,846
- Issue date Nov 24, 2020
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,775,326
- Issue date Sep 15, 2020
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,712,295
- Issue date Jul 14, 2020
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,600,176
- Issue date Mar 24, 2020
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,504,219
- Issue date Dec 10, 2019
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,410,824
- Issue date Sep 10, 2019
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Template substrate for use in adjusting focus offset for defect det...
- Patent number 10,359,370
- Issue date Jul 23, 2019
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection apparatus, mask evaluation method and mask evaluati...
- Patent number 10,026,011
- Issue date Jul 17, 2018
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Work management system and work management method
- Patent number 10,019,764
- Issue date Jul 10, 2018
- Omron Corporation
- Sadao Sugiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Work management system and work management method
- Patent number 9,959,578
- Issue date May 1, 2018
- Omron Corporation
- Sadao Sugiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Work management system and work management method
- Patent number 9,953,374
- Issue date Apr 24, 2018
- Omron Corporation
- Sadao Sugiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Work management system and work management method
- Patent number 9,953,376
- Issue date Apr 24, 2018
- Omron Corporation
- Sadao Sugiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Work management system and work management method
- Patent number 9,953,375
- Issue date Apr 24, 2018
- Omron Corporation
- Sadao Sugiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection method, template substrate, and focus offset method
- Patent number 9,804,103
- Issue date Oct 31, 2017
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and template
- Patent number 9,797,846
- Issue date Oct 24, 2017
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam drawing apparatus and drawing data generation...
- Patent number 9,779,913
- Issue date Oct 3, 2017
- NuFlare Technology, Inc.
- Shigehiro Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask inspection apparatus and mask inspection method
- Patent number 9,626,755
- Issue date Apr 18, 2017
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 9,542,586
- Issue date Jan 10, 2017
- Nuflare Technology, Inc.
- Eiji Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 9,202,270
- Issue date Dec 1, 2015
- NuFlare Technology, Inc.
- Takafumi Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect estimation device and method and inspection system and method
- Patent number 9,177,372
- Issue date Nov 3, 2015
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONTROL APPARATUS, CONTROL METHOD AND PROGRAM
- Publication number 20250062992
- Publication date Feb 20, 2025
- Nippon Telegraph and Telephone Corporation
- Hideo TSUCHIYA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NETWORK CONTROLLER, NETWORK CONTROLL METHOD, AND NETWORK CONTROLL P...
- Publication number 20240305556
- Publication date Sep 12, 2024
- Nippon Telegraph and Telephone Corporation
- Takayuki NAKAMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CONTROL APPARATUS, CONTROL METHOD, PROGRAM, AND COMMUNICATION SYSTEM
- Publication number 20230327993
- Publication date Oct 12, 2023
- Nippon Telegraph and Telephone Corporation
- Mitsuo AMASAKA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOAD DISTRIBUTION SYSTEM AND LOAD DISTRIBUTION METHOD
- Publication number 20220182325
- Publication date Jun 9, 2022
- Nippon Telegraph and Telephone Corporation
- Akihiro Kimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DETERMINATION DEVICE, GATEWAY, DETERMINATION METHOD, AND DETERMINAT...
- Publication number 20210344577
- Publication date Nov 4, 2021
- Nippon Telegraph and Telephone Corporation
- Hideo Tsuchiya
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MANAGEMENT DEVICE AND MANAGEMENT METHOD
- Publication number 20210297481
- Publication date Sep 23, 2021
- Nippon Telegraph and Telephone Corporation
- Katsuma Miyamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NOTIFICATION DEVICE AND NOTIFICATION METHOD
- Publication number 20210297276
- Publication date Sep 23, 2021
- Nippon Telegraph and Telephone Corporation
- Shunsuke HOMMA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOAD DISTRIBUTION SYSTEM AND LOAD DISTRIBUTION METHOD
- Publication number 20210297357
- Publication date Sep 23, 2021
- Nippon Telegraph and Telephone Corporation
- Akihiro Kimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMMUNICATION SYSTEM AND COMMUNICATION METHOD
- Publication number 20210168118
- Publication date Jun 3, 2021
- Shinya KAWANO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FUNCTION MANAGEMENT DEVICE, FUNCTION MANAGEMENT METHOD, AND COMMUNI...
- Publication number 20210119822
- Publication date Apr 22, 2021
- Nippon Telegraph and Telephone Corporation
- Hideo TSUCHIYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Load Distribution System and Load Distribution Method
- Publication number 20210014165
- Publication date Jan 14, 2021
- Nippon Telegraph and Telephone Corporation
- Akihiro KIMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMMUNICATION DEVICE, COMMUNICATION METHOD AND PROGRAM
- Publication number 20200412690
- Publication date Dec 31, 2020
- Nippon Telegraph and Telephone Corporation
- Katsuma MIYAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electron Beam Inspection Apparatus and Electron Beam Inspection Method
- Publication number 20190369035
- Publication date Dec 5, 2019
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD
- Publication number 20190277782
- Publication date Sep 12, 2019
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20190279348
- Publication date Sep 12, 2019
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20190213726
- Publication date Jul 11, 2019
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20190066286
- Publication date Feb 28, 2019
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD
- Publication number 20180261424
- Publication date Sep 13, 2018
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPLATE SUBSTRATE FOR USE IN ADJUSTING FOCUS OFFSET FOR DEFECT DET...
- Publication number 20180045656
- Publication date Feb 15, 2018
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20170352142
- Publication date Dec 7, 2017
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND TEMPLATE
- Publication number 20160305892
- Publication date Oct 20, 2016
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DRAWING APPARATUS AND DRAWING DATA GENERATION...
- Publication number 20160284510
- Publication date Sep 29, 2016
- NuFlare Technology, Inc.
- Shigehiro HARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20160203595
- Publication date Jul 14, 2016
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20160171674
- Publication date Jun 16, 2016
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD
- Publication number 20160048930
- Publication date Feb 18, 2016
- Omron Corporation
- Sadao Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD
- Publication number 20160042505
- Publication date Feb 11, 2016
- NuFlare Technology, Inc.
- Hideo TSUCHIYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD
- Publication number 20160012362
- Publication date Jan 14, 2016
- Omron Corporation
- Sadao Sugiyama
- G02 - OPTICS
Information Patent Application
WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD
- Publication number 20160012380
- Publication date Jan 14, 2016
- Omron Corporation
- Sadao Sugiyama
- G02 - OPTICS
Information Patent Application
WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD
- Publication number 20160012361
- Publication date Jan 14, 2016
- Omron Corporation
- Sadao Sugiyama
- G02 - OPTICS
Information Patent Application
WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD
- Publication number 20160012363
- Publication date Jan 14, 2016
- Omron Corporation
- Sadao Sugiyama
- G02 - OPTICS

Hideo Tsuchiya

Person

Patents Grantslast 30 patents

Communication system and communication method

Load distribution system and load distribution method

Load distribution system and load distribution method

Management device and management method

Notification device and notification method

Function management apparatus, function management method and commu...

Communication apparatus, communication method and program

Load distribution system and load distribution method

Inspection method and inspection apparatus

Pattern inspection method and pattern inspection apparatus

Pattern inspection apparatus and pattern inspection method

Electron beam inspection apparatus and electron beam inspection method

Electron beam inspection apparatus and electron beam inspection method

Inspection method and inspection apparatus

Inspection apparatus and inspection method

Electron beam inspection apparatus and electron beam inspection method

Template substrate for use in adjusting focus offset for defect det...

Mask inspection apparatus, mask evaluation method and mask evaluati...

Work management system and work management method

Work management system and work management method

Work management system and work management method

Work management system and work management method

Work management system and work management method

Inspection method, template substrate, and focus offset method

Inspection method and template

Charged particle beam drawing apparatus and drawing data generation...

Mask inspection apparatus and mask inspection method

Pattern inspection apparatus and pattern inspection method

Pattern inspection apparatus and pattern inspection method

Defect estimation device and method and inspection system and method

Patents Applicationslast 30 patents

CONTROL APPARATUS, CONTROL METHOD AND PROGRAM

NETWORK CONTROLLER, NETWORK CONTROLL METHOD, AND NETWORK CONTROLL P...

CONTROL APPARATUS, CONTROL METHOD, PROGRAM, AND COMMUNICATION SYSTEM

LOAD DISTRIBUTION SYSTEM AND LOAD DISTRIBUTION METHOD

DETERMINATION DEVICE, GATEWAY, DETERMINATION METHOD, AND DETERMINAT...

MANAGEMENT DEVICE AND MANAGEMENT METHOD

NOTIFICATION DEVICE AND NOTIFICATION METHOD

LOAD DISTRIBUTION SYSTEM AND LOAD DISTRIBUTION METHOD

COMMUNICATION SYSTEM AND COMMUNICATION METHOD

FUNCTION MANAGEMENT DEVICE, FUNCTION MANAGEMENT METHOD, AND COMMUNI...

Load Distribution System and Load Distribution Method

COMMUNICATION DEVICE, COMMUNICATION METHOD AND PROGRAM

Electron Beam Inspection Apparatus and Electron Beam Inspection Method

ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD AND INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD

TEMPLATE SUBSTRATE FOR USE IN ADJUSTING FOCUS OFFSET FOR DEFECT DET...

INSPECTION METHOD AND INSPECTION APPARATUS

INSPECTION METHOD AND TEMPLATE

CHARGED PARTICLE BEAM DRAWING APPARATUS AND DRAWING DATA GENERATION...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION METHOD AND INSPECTION APPARATUS

WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD

MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD

WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD

WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD

WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD

WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD