Hideo Tsukamoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor differential pressure measuring device
- Patent number 5,959,213
- Issue date Sep 28, 1999
- Yokogawa Electric Corporation
- Kyoichi Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor type differential pressure measurement apparatus and...
- Patent number 5,375,473
- Issue date Dec 27, 1994
- Yokogawa Electric Corporation
- Kyoichi Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Vibrating type pressure measuring device
- Patent number 5,123,282
- Issue date Jun 23, 1992
- Yokogawa Electric Corporation
- Kyoichi Ikeda
- G01 - MEASURING TESTING