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Hideshi Tanaka
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Hachioji, JP
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last 30 patents
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Patent Grant
Contact judging circuit and contact judging method for impedance me...
Patent number
5,416,470
Issue date
May 16, 1995
Hewlett-Packard Company
Hideshi Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Two-terminal circuit element measuring apparatus for performing con...
Patent number
5,321,363
Issue date
Jun 14, 1994
Hewlett-Packard Company
Hideki Wakamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring vector voltage ratio
Patent number
4,888,701
Issue date
Dec 19, 1989
Hewlett-Packard Company
Tomio Wakasugi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus which uses a simulated inductor in the measurement of an...
Patent number
4,885,528
Issue date
Dec 5, 1989
Hewlett-Packard Company
Hideshi Tanaka
G06 - COMPUTING CALCULATING COUNTING