Hideshi Tsugui

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Kyotanabe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Capacitance measuring apparatus and method, and program
- Patent number 7,205,776
- Issue date Apr 17, 2007
- Omron Corporation
- Masahiro Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Input device
- Patent number 7,019,765
- Issue date Mar 28, 2006
- Omron Corporation
- Toshimitsu Fujiwara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Capacitance measuring apparatus and method, and program
- Publication number 20060055416
- Publication date Mar 16, 2006
- Omron Corporation
- Masahiro Kinoshita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Conductor detecting switch
- Publication number 20040264150
- Publication date Dec 30, 2004
- Hideshi Tsugui
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Input device
- Publication number 20030102875
- Publication date Jun 5, 2003
- Toshimitsu Fujiwara
- G01 - MEASURING TESTING