Hideshi Ueda

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Higashiosaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for picking up image of component, and component...
- Patent number 7,199,816
- Issue date Apr 3, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kazuhiro Ikurumi
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution image pickup method and apparatus therefor
- Patent number 6,256,066
- Issue date Jul 3, 2001
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Display screen inspection method
- Patent number 5,966,458
- Issue date Oct 12, 1999
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign matter detection device
- Patent number 5,331,396
- Issue date Jul 19, 1994
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G01 - MEASURING TESTING
Information Patent Grant
Pattern position recognizing apparatus
- Patent number 5,014,330
- Issue date May 7, 1991
- Matsushita Electric Industrial Co., Ltd.
- Akira Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape recognition apparatus
- Patent number 4,845,764
- Issue date Jul 4, 1989
- Matsushita Electric Industrial Co., Ltd.
- Hideshi Ueda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Device and method for picking up image of component, and component...
- Publication number 20040150742
- Publication date Aug 5, 2004
- Kazuhiro Ikurumi
- G01 - MEASURING TESTING