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Hidetaka HAYAMA
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Testing system and method of starting testing system
Patent number
11,366,127
Issue date
Jun 21, 2022
Sysmex Corporation
Ken Nishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter, specimen testing system and specimen transpor...
Patent number
9,752,979
Issue date
Sep 5, 2017
Sysmex Corporation
Hidetaka Hayama
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter and specimen imaging system
Patent number
9,297,823
Issue date
Mar 29, 2016
Sysmex Corporation
Mitsuo Yamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter, specimen testing system and specimen transpor...
Patent number
9,157,925
Issue date
Oct 13, 2015
Sysmex Corporation
Mitsuo Yamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter
Patent number
D714460
Issue date
Sep 30, 2014
Sysmex Corporation
Fumie Shibata
D24 - Medical and laboratory equipment
Information
Patent Grant
Automatic analyzer
Patent number
D704348
Issue date
May 6, 2014
Sysmex Corporation
Fumie Shibata
D24 - Medical and laboratory equipment
Patents Applications
last 30 patents
Information
Patent Application
CONTAINER TRANSFER METHOD AND CONTAINER TRANSFER APPARATUS
Publication number
20230228781
Publication date
Jul 20, 2023
SYSMEX CORPORATION
Hidetaka HAYAMA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSFER DEVICE AND SPECIMEN TESTING SYSTEM
Publication number
20230228779
Publication date
Jul 20, 2023
SYSMEX CORPORATION
Hidetaka HAYAMA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TESTING SYSTEM, RACK TRANSPORTATION SYSTEM, RACK TRANSPORT...
Publication number
20230228780
Publication date
Jul 20, 2023
SYSMEX CORPORATION
Hidetaka HAYAMA
G01 - MEASURING TESTING
Information
Patent Application
QUALITY CONTROL METHOD OF SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANA...
Publication number
20220308076
Publication date
Sep 29, 2022
SYSMEX CORPORATION
Yuji WAKAMIYA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
METHOD FOR CONTROLLING SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYS...
Publication number
20220283196
Publication date
Sep 8, 2022
SYSMEX CORPORATION
Yuji WAKAMIYA
G01 - MEASURING TESTING
Information
Patent Application
QUALITY CONTROL METHOD OF SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANA...
Publication number
20220283194
Publication date
Sep 8, 2022
SYSMEX CORPORATION
Yuji WAKAMIYA
G01 - MEASURING TESTING
Information
Patent Application
TESTING SYSTEM AND METHOD OF STARTING TESTING SYSTEM
Publication number
20220276272
Publication date
Sep 1, 2022
SYSMEX CORPORATION
Ken NISHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR TRANSPORTING APPARATUS, SMEAR IMAGE CAPTURE SYSTEM, AND SMEAR...
Publication number
20200166533
Publication date
May 28, 2020
SYSMEX CORPORATION
Hidetaka HAYAMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TESTING SYSTEM AND METHOD OF STARTING TESTING SYSTEM
Publication number
20190049474
Publication date
Feb 14, 2019
SYSMEX CORPORATION
Ken NISHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR TRANSPORTING APPARATUS, SMEAR IMAGE CAPTURE SYSTEM, AND SMEAR...
Publication number
20180031588
Publication date
Feb 1, 2018
SYSMEX CORPORATION
Takayuki NAKAJIMA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORTER, SPECIMEN TESTING SYSTEM AND SPECIMEN TRANSPOR...
Publication number
20140092382
Publication date
Apr 3, 2014
SYSMEX CORPORATION
Hidetaka HAYAMA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORTER, SPECIMEN TESTING SYSTEM AND SPECIMEN TRANSPOR...
Publication number
20140093967
Publication date
Apr 3, 2014
SYSMEX CORPORATION
Mitsuo YAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORTER AND SPECIMEN IMAGING SYSTEM
Publication number
20140093423
Publication date
Apr 3, 2014
SYSMEX CORPORATION
Mitsuo YAMASAKI
G01 - MEASURING TESTING