Hidetaka SAWADA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Aberration corrector and electron microscope
- Patent number 10,720,301
- Issue date Jul 21, 2020
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distortion measurement method for electron microscope image, electr...
- Patent number 10,541,111
- Issue date Jan 21, 2020
- Jeol Ltd.
- Yuji Konyuba
- G01 - MEASURING TESTING
Information Patent Grant
Liner tube and electron microscope
- Patent number 9,997,327
- Issue date Jun 12, 2018
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and measurement method
- Patent number 9,859,095
- Issue date Jan 2, 2018
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-stage dodecapole aberration corrector for charged-particle beam
- Patent number 9,793,088
- Issue date Oct 17, 2017
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole lens, aberration corrector, and electron microscope
- Patent number 9,349,565
- Issue date May 24, 2016
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spherical aberration corrector, method of spherical aberration corr...
- Patent number 9,256,068
- Issue date Feb 9, 2016
- Jeol Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING
Information Patent Grant
Method for axial alignment of charged particle beam and charged par...
- Patent number 8,907,298
- Issue date Dec 9, 2014
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for axial alignment of charged particle beam and charged par...
- Patent number 8,847,172
- Issue date Sep 30, 2014
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chromatic aberration corrector and electron microscope
- Patent number 8,785,880
- Issue date Jul 22, 2014
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,541,755
- Issue date Sep 24, 2013
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 8,431,897
- Issue date Apr 30, 2013
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spherical aberration corrector and method of spherical aberration c...
- Patent number 8,389,951
- Issue date Mar 5, 2013
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chromatic aberration corrector for charged-particle beam system and...
- Patent number 8,178,850
- Issue date May 15, 2012
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and method of aberration...
- Patent number 8,168,956
- Issue date May 1, 2012
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration correction system
- Patent number 7,723,683
- Issue date May 25, 2010
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring aberrations and correcting aberrations using Ro...
- Patent number 7,619,220
- Issue date Nov 17, 2009
- Jeol Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle beam system
- Patent number 7,598,496
- Issue date Oct 6, 2009
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Aberration Measurement Method
- Publication number 20230349839
- Publication date Nov 2, 2023
- JEOL Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING
Information Patent Application
Aberration Correcting Device and Electron Microscope
- Publication number 20230268155
- Publication date Aug 24, 2023
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration Corrector and Electron Microscope
- Publication number 20190228945
- Publication date Jul 25, 2019
- JEOL Ltd.
- Hidetaka SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distortion Measurement Method for Electron Microscope Image, Electr...
- Publication number 20180342370
- Publication date Nov 29, 2018
- JEOL Ltd.
- Yuji Konyuba
- G01 - MEASURING TESTING
Information Patent Application
Liner Tube and Electron Microscope
- Publication number 20180166252
- Publication date Jun 14, 2018
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Measurement Method
- Publication number 20170025248
- Publication date Jan 26, 2017
- THE UNIVERSITY OF TOKYO
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Lens, Aberration Corrector, and Electron Microscope
- Publication number 20150332889
- Publication date Nov 19, 2015
- JEOL Ltd.
- Hidetaka SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spherical Aberration Corrector, Method of Spherical Aberration Corr...
- Publication number 20150029593
- Publication date Jan 29, 2015
- JEOL Ltd.
- Hidetaka Sawada
- G02 - OPTICS
Information Patent Application
METHOD FOR AXIAL ALIGNMENT OF CHARGED PARTICLE BEAM AND CHARGED PAR...
- Publication number 20140367585
- Publication date Dec 18, 2014
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHROMATIC ABERRATION CORRECTOR AND ELECTRON MICROSCOPE
- Publication number 20140158901
- Publication date Jun 12, 2014
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20120187293
- Publication date Jul 26, 2012
- JEOL, LTD
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Axial Alignment of Charged Particle Beam and Charged Par...
- Publication number 20120119107
- Publication date May 17, 2012
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spherical Aberration Corrector and Method of Spherical Aberration C...
- Publication number 20110284758
- Publication date Nov 24, 2011
- JEOL Ltd.
- Hidetaka SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chromatic Aberration Corrector for Charged-Particle Beam System and...
- Publication number 20100084567
- Publication date Apr 8, 2010
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration Corrector and Charged-Particle Beam System Equipped Ther...
- Publication number 20100072387
- Publication date Mar 25, 2010
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Electron Microscope and Method of Aberration...
- Publication number 20090224169
- Publication date Sep 10, 2009
- JEOL Ltd.
- Hidetaka SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration Correction System
- Publication number 20090032709
- Publication date Feb 5, 2009
- JEOL Ltd.
- Hidetaka SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Beam System
- Publication number 20080128635
- Publication date Jun 5, 2008
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration Corrector and Method of Aberration Correction
- Publication number 20080093563
- Publication date Apr 24, 2008
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of measuring aberrations and correcting aberrations using ro...
- Publication number 20070120055
- Publication date May 31, 2007
- JEOL Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING

Hidetaka SAWADA

Person

Patents Grantslast 30 patents

Aberration corrector and electron microscope

Distortion measurement method for electron microscope image, electr...

Liner tube and electron microscope

Electron microscope and measurement method

Two-stage dodecapole aberration corrector for charged-particle beam

Multipole lens, aberration corrector, and electron microscope

Spherical aberration corrector, method of spherical aberration corr...

Method for axial alignment of charged particle beam and charged par...

Method for axial alignment of charged particle beam and charged par...

Chromatic aberration corrector and electron microscope

Electron microscope

Transmission electron microscope

Spherical aberration corrector and method of spherical aberration c...

Chromatic aberration corrector for charged-particle beam system and...

Scanning transmission electron microscope and method of aberration...

Aberration correction system

Method of measuring aberrations and correcting aberrations using Ro...

Charged-particle beam system

Patents Applicationslast 30 patents

Electron Microscope and Aberration Measurement Method

Aberration Correcting Device and Electron Microscope

Aberration Corrector and Electron Microscope

Distortion Measurement Method for Electron Microscope Image, Electr...

Liner Tube and Electron Microscope

Electron Microscope and Measurement Method

Multipole Lens, Aberration Corrector, and Electron Microscope

Spherical Aberration Corrector, Method of Spherical Aberration Corr...

METHOD FOR AXIAL ALIGNMENT OF CHARGED PARTICLE BEAM AND CHARGED PAR...

CHROMATIC ABERRATION CORRECTOR AND ELECTRON MICROSCOPE

Transmission Electron Microscope

Method for Axial Alignment of Charged Particle Beam and Charged Par...

Spherical Aberration Corrector and Method of Spherical Aberration C...

Chromatic Aberration Corrector for Charged-Particle Beam System and...

Aberration Corrector and Charged-Particle Beam System Equipped Ther...

Scanning Transmission Electron Microscope and Method of Aberration...

Aberration Correction System

Charged-Particle Beam System

Aberration Corrector and Method of Aberration Correction

Method of measuring aberrations and correcting aberrations using ro...