Hideto Iwaoka

Person

Musashino, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fabry-Perot filter, wavelength-selective infrared detector and infr...
- Patent number 6,590,710
- Issue date Jul 8, 2003
- Yokogawa Electric Corporation
- Hitosh Hara
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optically controlled measurement probe system
- Patent number 5,583,446
- Issue date Dec 10, 1996
- Teratec Corporation
- Koichiro Takeuchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Distributed feedback semiconductor laser
- Patent number 5,289,494
- Issue date Feb 22, 1994
- Optical Measurement Technology Development Co., Ltd.
- Kunio Tada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche photodiode with AliNAsP cap layer
- Patent number 5,189,309
- Issue date Feb 23, 1993
- Optical Measurement Technology Development Co., Ltd.
- Morio Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor laser
- Patent number 5,077,752
- Issue date Dec 31, 1991
- Optical Measurement Technology Development Co., Ltd.
- Kunio Tada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical integrated modulator
- Patent number 5,061,030
- Issue date Oct 29, 1991
- Optical Measurement Technology Development Co., Ltd.
- Hiroshi Miyamoto
- G02 - OPTICS
Information Patent Grant
Optical frequency synthesizer/sweeper
- Patent number 4,912,526
- Issue date Mar 27, 1990
- Yokogawa Electric Corporation
- Hideto Iwaoka
- G02 - OPTICS
Information Patent Grant
Optical frequency synthesizer/sweeper
- Patent number 4,893,353
- Issue date Jan 9, 1990
- Yokogawa Electric Corporation
- Hideto Iwaoka
- G02 - OPTICS
Information Patent Grant
Optical frequency analyzer using a local oscillator heterodyne dete...
- Patent number 4,856,899
- Issue date Aug 15, 1989
- Yokogawa Electric Corporation
- Hideto Iwaoka
- G02 - OPTICS
Information Patent Grant
Semiconductor laser wavelength stabilizer
- Patent number 4,833,681
- Issue date May 23, 1989
- Yokogawa Electric Corporation
- Koji Akiyama
- G02 - OPTICS
Information Patent Grant
Time measuring apparatus
- Patent number 4,772,843
- Issue date Sep 20, 1988
- Yokogawa Electric Corporation
- Takao Asaka
- G04 - HOROLOGY
Information Patent Grant
Hologram scanner
- Patent number 4,768,847
- Issue date Sep 6, 1988
- Yokogawa Electric Corporation
- Hideto Iwaoka
- G02 - OPTICS
Information Patent Grant
Coil arrangement for producing static magnetic field
- Patent number 4,716,370
- Issue date Dec 29, 1987
- Yokogawa Electric Corporation
- Yuji Inoue
- G01 - MEASURING TESTING
Information Patent Grant
NMR imaging apparatus
- Patent number 4,700,136
- Issue date Oct 13, 1987
- Yokogawa Electric Corporation
- Keiki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic gain control apparatus for NMR imaging system
- Patent number 4,700,138
- Issue date Oct 13, 1987
- Yokogawa Electric Corporation
- Toru Shimazaki
- G01 - MEASURING TESTING
Information Patent Grant
Nuclear magnetic resonance imaging device
- Patent number 4,694,250
- Issue date Sep 15, 1987
- Yokogawa Electric Corporation
- Hideto Iwaoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NMR apparatus compensated for primary field changes
- Patent number 4,684,889
- Issue date Aug 4, 1987
- Yokogawa Hokushin Electric Corporation
- Keiki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
NMR imaging apparatus
- Patent number 4,665,368
- Issue date May 12, 1987
- Yokogawa Hokushin Electric Corporation
- Tadashi Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
NMR image forming apparatus
- Patent number 4,663,592
- Issue date May 5, 1987
- Yokogawa Hokushin Electric Corporation
- Keiki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Examination method and apparatus utilizing nuclear magnetic resonance
- Patent number 4,651,097
- Issue date Mar 17, 1987
- Yokogawa Hokushin Electric Corporation
- Hideto Iwaoka
- G01 - MEASURING TESTING
Information Patent Grant
High resolution digital diffraction grating scale encoder
- Patent number 4,629,886
- Issue date Dec 16, 1986
- Yokogawa Hokushin Electric Corporation
- Koji Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field production coil for nuclear magnetic resonance imagi...
- Patent number 4,623,864
- Issue date Nov 18, 1986
- Yokogawa Hokushin Electric Corporation
- Yuji Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field generating coil assembly for nuclear magnetic resona...
- Patent number 4,584,548
- Issue date Apr 22, 1986
- Yokogawa Hokushin Electric Corporation
- Yuji Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examination by nuclear magnetic resonance
- Patent number 4,536,712
- Issue date Aug 20, 1985
- Yokogawa Hokushin Electric Corporation
- Hideto Iwaoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fabry-perot filter, wavelength-selective infrared detector and infr...
- Publication number 20030116711
- Publication date Jun 26, 2003
- YOKOGAWA ELECTRIC CORPORATION, a Japan corporation
- Hitosh Hara
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot filter, wavelength-selective infrared detector and infr...
- Publication number 20010015810
- Publication date Aug 23, 2001
- Hitosh Hara
- G01 - MEASURING TESTING

Hideto Iwaoka

Person

Patents Grantslast 30 patents

Fabry-Perot filter, wavelength-selective infrared detector and infr...

Electro-optically controlled measurement probe system

Distributed feedback semiconductor laser

Avalanche photodiode with AliNAsP cap layer

Semiconductor laser

Optical integrated modulator

Optical frequency synthesizer/sweeper

Optical frequency synthesizer/sweeper

Optical frequency analyzer using a local oscillator heterodyne dete...

Semiconductor laser wavelength stabilizer

Time measuring apparatus

Hologram scanner

Coil arrangement for producing static magnetic field

NMR imaging apparatus

Automatic gain control apparatus for NMR imaging system

Nuclear magnetic resonance imaging device

NMR apparatus compensated for primary field changes

NMR imaging apparatus

NMR image forming apparatus

Examination method and apparatus utilizing nuclear magnetic resonance

High resolution digital diffraction grating scale encoder

Magnetic field production coil for nuclear magnetic resonance imagi...

Magnetic field generating coil assembly for nuclear magnetic resona...

Method and apparatus for examination by nuclear magnetic resonance

Patents Applicationslast 30 patents

Fabry-perot filter, wavelength-selective infrared detector and infr...

Fabry-perot filter, wavelength-selective infrared detector and infr...