Hidetoshi Morokuma

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and mass analyzing method for efficiently ionizin...
- Patent number 9,543,135
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,281,169
- Issue date Mar 8, 2016
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation container
- Patent number D748813
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Koji Ishiguro
- D24 - Medical and laboratory equipment
Information Patent Grant
Component analyzer
- Patent number D746476
- Issue date Dec 29, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Noda
- D24 - Medical and laboratory equipment
Information Patent Grant
Mass spectrometer and mass analyzing method
- Patent number 9,184,037
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,171,704
- Issue date Oct 27, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry
- Patent number 9,105,453
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Tsukasa Shishika
- G08 - SIGNALLING
Information Patent Grant
Mass spectrometer
- Patent number 9,006,679
- Issue date Apr 14, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring cross-sectional shape of a patt...
- Patent number 8,881,067
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for creating imaging recipe
- Patent number RE45224
- Issue date Oct 28, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- 716 - Computer-aided design and analysis of circuits and semiconductor masks
Information Patent Grant
Method and apparatus for creating imaging recipe
- Patent number RE45204
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- 716 - Computer-aided design and analysis of circuits and semiconductor masks
Information Patent Grant
Mass spectrometer
- Patent number 8,866,070
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and a method for imaging a specimen us...
- Patent number 8,853,630
- Issue date Oct 7, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass spectrometry
- Patent number 8,803,084
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Kazushige Nishimura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Sample holder for a component analyzer
- Patent number D711011
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Noda
- D24 - Medical and laboratory equipment
Information Patent Grant
Component analyzer
- Patent number D708530
- Issue date Jul 8, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Noda
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Mass spectrometry method
- Patent number 8,710,430
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,680,464
- Issue date Mar 25, 2014
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,669,518
- Issue date Mar 11, 2014
- Hitachi High-Technologies Corporation
- Kouji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,664,588
- Issue date Mar 4, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Noda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning electron microscope
- Patent number 8,666,165
- Issue date Mar 4, 2014
- Hitachi, Ltd.
- Satoru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and a method for imaging a specimen us...
- Patent number 8,642,957
- Issue date Feb 4, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measuring method and pattern measuring device
- Patent number 8,507,856
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement apparatus
- Patent number 8,445,871
- Issue date May 21, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzer, ionization apparatus and analyzing method
- Patent number 8,368,013
- Issue date Feb 5, 2013
- Hitachi High-Technologies Corporation
- Masako Ishimaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring cross-sectional shape of a patt...
- Patent number 8,356,260
- Issue date Jan 15, 2013
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample dimension inspecting/measuring method and sample dimension i...
- Patent number 8,338,804
- Issue date Dec 25, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- G01 - MEASURING TESTING
Information Patent Grant
Drug detection equipment
- Patent number 8,319,194
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Makoto Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern matching method and computer program for executing pattern...
- Patent number 8,244,042
- Issue date Aug 14, 2012
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image forming method and charged particle beam apparatus
- Patent number 8,203,504
- Issue date Jun 19, 2012
- Hitachi High-Technologies Corporation
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER
- Publication number 20150187554
- Publication date Jul 2, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi MOROKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY
- Publication number 20150108341
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Tsukasa Shishika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20150041641
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi MOROKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN US...
- Publication number 20140145078
- Publication date May 29, 2014
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20130320207
- Publication date Dec 5, 2013
- Hidetoshi MOROKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MONITORING CROSS-SECTIONAL SHAPE OF A PATT...
- Publication number 20130195346
- Publication date Aug 1, 2013
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY
- Publication number 20130161507
- Publication date Jun 27, 2013
- Hitachi High-Technologies Corporation
- Kazushige NISHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20130056633
- Publication date Mar 7, 2013
- Yuichiro HASHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS ANALYZING METHOD
- Publication number 20130048851
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Shun KUMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20130032711
- Publication date Feb 7, 2013
- Hitachi High-Technologies Corporation
- Koji ISHIGURO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD
- Publication number 20120326027
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS ANALYZING METHOD
- Publication number 20120326022
- Publication date Dec 27, 2012
- Shun KUMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20120248305
- Publication date Oct 4, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki NODA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20120211653
- Publication date Aug 23, 2012
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and a Method for Imaging a Specimen Us...
- Publication number 20120181426
- Publication date Jul 19, 2012
- Atsushi MIYAMOTO
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20120112061
- Publication date May 10, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi MOROKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRUG DETECTION EQUIPMENT
- Publication number 20120049055
- Publication date Mar 1, 2012
- Makoto Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20110315869
- Publication date Dec 29, 2011
- Hitachi High-Technologies Corporation
- KOUJI ISHIGURO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20110253891
- Publication date Oct 20, 2011
- Hitachi High-Technologies Corporation
- Yuichiro HASHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZER, IONIZATION APPARATUS AND ANALYZING METHOD
- Publication number 20110253889
- Publication date Oct 20, 2011
- Hitachi High-Technologies Corporation
- Masako ISHIMARU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION I...
- Publication number 20110158543
- Publication date Jun 30, 2011
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN...
- Publication number 20110150345
- Publication date Jun 23, 2011
- Hitachi High-Technologies Corporation
- Akiyuki SUGIYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20110032176
- Publication date Feb 10, 2011
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MEASUREMENT APPARATUS
- Publication number 20100202654
- Publication date Aug 12, 2010
- Hitachi High-Technologies Corporation
- Ryoichi MATSUOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM ADJUSTING METHOD AND CHARGED PARTICLE BEAM AP...
- Publication number 20100181478
- Publication date Jul 22, 2010
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN DISPLACEMENT MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20100140472
- Publication date Jun 10, 2010
- Hitachi High-Technologies Corporation
- Takumichi SUTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Detecting a Defect
- Publication number 20100138801
- Publication date Jun 3, 2010
- Hitachi High-Technologies Corp.
- Ryoichi MATSUOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION I...
- Publication number 20090218491
- Publication date Sep 3, 2009
- Hidetoshi Morokuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20090200465
- Publication date Aug 13, 2009
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MEASUREMENT APPARATUS
- Publication number 20090039263
- Publication date Feb 12, 2009
- Ryoichi MATSUOKA
- G06 - COMPUTING CALCULATING COUNTING

Hidetoshi Morokuma

Person

Patents Grantslast 30 patents

Mass spectrometer and mass analyzing method for efficiently ionizin...

Mass spectrometer

Sample preparation container

Component analyzer

Mass spectrometer and mass analyzing method

Mass spectrometer

Mass spectrometer and mass spectrometry

Mass spectrometer

Method and apparatus for monitoring cross-sectional shape of a patt...

Method and apparatus for creating imaging recipe

Method and apparatus for creating imaging recipe

Mass spectrometer

Scanning electron microscope and a method for imaging a specimen us...

Mass spectrometer and mass spectrometry

Sample holder for a component analyzer

Component analyzer

Mass spectrometry method

Mass spectrometer

Mass spectrometer

Mass spectrometer

Scanning electron microscope

Scanning electron microscope and a method for imaging a specimen us...

Pattern measuring method and pattern measuring device

Pattern measurement apparatus

Analyzer, ionization apparatus and analyzing method

Method and apparatus for monitoring cross-sectional shape of a patt...

Sample dimension inspecting/measuring method and sample dimension i...

Drug detection equipment

Pattern matching method and computer program for executing pattern...

Image forming method and charged particle beam apparatus

Patents Applicationslast 30 patents

MASS SPECTROMETER

MASS SPECTROMETER AND MASS SPECTROMETRY

MASS SPECTROMETER

SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN US...

MASS SPECTROMETER

METHOD AND APPARATUS FOR MONITORING CROSS-SECTIONAL SHAPE OF A PATT...

MASS SPECTROMETER AND MASS SPECTROMETRY

MASS SPECTROMETER

MASS SPECTROMETER AND MASS ANALYZING METHOD

Mass Spectrometer

MASS SPECTROMETRY METHOD

MASS SPECTROMETER AND MASS ANALYZING METHOD

MASS SPECTROMETER

PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE

Scanning Electron Microscope and a Method for Imaging a Specimen Us...

MASS SPECTROMETER

DRUG DETECTION EQUIPMENT

MASS SPECTROMETER

MASS SPECTROMETER

ANALYZER, IONIZATION APPARATUS AND ANALYZING METHOD

SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION I...

PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN...

IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS

PATTERN MEASUREMENT APPARATUS

CHARGED PARTICLE BEAM ADJUSTING METHOD AND CHARGED PARTICLE BEAM AP...

PATTERN DISPLACEMENT MEASURING METHOD AND PATTERN MEASURING DEVICE

System and Method for Detecting a Defect

SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION I...

PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE

PATTERN MEASUREMENT APPARATUS