Hidetoshi Sato

Person

Ebina, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 8,907,267
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of checking a possibility of executing a virtual machine
- Patent number 8,645,953
- Issue date Feb 4, 2014
- Hitachi, Ltd.
- Tomoki Sekiguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample conveying mechanism
- Patent number 8,585,112
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Katsuya Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement methods and pattern measurement equipment
- Patent number 8,295,584
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of checking a possibility of executing a virtual machine
- Patent number 8,291,412
- Issue date Oct 16, 2012
- Hitachi, Ltd.
- Tomoki Sekiguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope for inspecting dimension and shape of a pattern...
- Patent number 8,199,191
- Issue date Jun 12, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample transfer unit and sample transferring method
- Patent number 8,173,971
- Issue date May 8, 2012
- Hitachi High-Technologies Corporation
- Takashi Gunji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device allocation changing method
- Patent number 8,028,184
- Issue date Sep 27, 2011
- Hitachi, Ltd.
- Tomoki Sekiguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement method and pattern measurement system
- Patent number 7,800,060
- Issue date Sep 21, 2010
- Hitachi High-Technologies Corporation
- Hidetoshi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Sample transfer unit and sample transferring method
- Patent number 7,737,416
- Issue date Jun 15, 2010
- Hitachi High-Technologies Corporation
- Takashi Gunji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,566,872
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Piezoelectric sensor
- Patent number 5,376,860
- Issue date Dec 27, 1994
- Oki Ceramic Industry Co, Ltd.
- Hidetoshi Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER, HYPERVISOR, AND METHOD FOR ALLOCATING PHYSICAL CORES
- Publication number 20160357647
- Publication date Dec 8, 2016
- Hitachi, Ltd
- Yoshihide SHIRAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140217274
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CHECKING A POSSIBILITY OF EXECUTING A VIRTUAL MACHINE
- Publication number 20130007743
- Publication date Jan 3, 2013
- Hitachi, Ltd
- Tomoki Sekiguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE CONVEYING MECHANISM
- Publication number 20110142578
- Publication date Jun 16, 2011
- Katsuya Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Transfer Unit and Sample Transferring Method
- Publication number 20100230592
- Publication date Sep 16, 2010
- Hitachi High-Technologies Corporation
- Takashi GUNJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIRTUAL SERVER SYSTEM, PHYSICAL CPU AND METHOD FOR ALLOCATING PHYSI...
- Publication number 20100125843
- Publication date May 20, 2010
- Hitachi, Ltd
- Jun SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MEASUREMENT METHODS AND PATTERN MEASUREMENT EQUIPMENT
- Publication number 20090238443
- Publication date Sep 24, 2009
- Hidetoshi Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MIGRATION BETWEEN VIRTUAL MACHINE AND PHYSICAL MACHINE AN...
- Publication number 20090150463
- Publication date Jun 11, 2009
- TOMOKI SEKIGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CHECKING A POSSIBILITY OF EXECUTING A VIRTUAL MACHINE
- Publication number 20090077552
- Publication date Mar 19, 2009
- Tomoki Sekiguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT SYSTEM
- Publication number 20090032707
- Publication date Feb 5, 2009
- Hitachi High-Technologies Corporation
- Hidetoshi SATO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE ALLOCATION CHANGING METHOD
- Publication number 20080307213
- Publication date Dec 11, 2008
- Tomoki SEKIGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE TRANSFER UNIT AND SAMPLE TRANSFERRING METHOD
- Publication number 20080203302
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Takashi Gunji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20080024601
- Publication date Jan 31, 2008
- Hidetoshi Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20070045539
- Publication date Mar 1, 2007
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS

Hidetoshi Sato

Person

Patents Grantslast 30 patents

Charged particle beam device

Method of checking a possibility of executing a virtual machine

Sample conveying mechanism

Pattern measurement methods and pattern measurement equipment

Method of checking a possibility of executing a virtual machine

Electron microscope for inspecting dimension and shape of a pattern...

Sample transfer unit and sample transferring method

Device allocation changing method

Pattern measurement method and pattern measurement system

Sample transfer unit and sample transferring method

Scanning electron microscope

Piezoelectric sensor

Patents Applicationslast 30 patents

COMPUTER, HYPERVISOR, AND METHOD FOR ALLOCATING PHYSICAL CORES

CHARGED PARTICLE BEAM DEVICE

METHOD OF CHECKING A POSSIBILITY OF EXECUTING A VIRTUAL MACHINE

SAMPLE CONVEYING MECHANISM

Sample Transfer Unit and Sample Transferring Method

VIRTUAL SERVER SYSTEM, PHYSICAL CPU AND METHOD FOR ALLOCATING PHYSI...

PATTERN MEASUREMENT METHODS AND PATTERN MEASUREMENT EQUIPMENT

METHOD OF MIGRATION BETWEEN VIRTUAL MACHINE AND PHYSICAL MACHINE AN...

METHOD OF CHECKING A POSSIBILITY OF EXECUTING A VIRTUAL MACHINE

PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT SYSTEM

DEVICE ALLOCATION CHANGING METHOD

SAMPLE TRANSFER UNIT AND SAMPLE TRANSFERRING METHOD

Electron microscope

Scanning electron microscope