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Hidetoshi SUGIYAMA
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Hitachinaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Automatic analyzer and the analyzing method using the same
Patent number
8,765,474
Issue date
Jul 1, 2014
Hitachi High-Technologies Corporation
Katsuhiro Kambara
G01 - MEASURING TESTING
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Patent Grant
Automatic analyzer
Patent number
8,409,507
Issue date
Apr 2, 2013
Hitachi High-Technologies Corporation
Hirokazu Iwamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and part feeding device used for the analyzer
Patent number
7,360,984
Issue date
Apr 22, 2008
Roche Diagnostics Corp.
Hidetoshi Sugiyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20080240989
Publication date
Oct 2, 2008
Hirokazu IWAMATSU
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND THE ANALYZING METHOD USING THE SAME
Publication number
20080213903
Publication date
Sep 4, 2008
Katsuhiro KAMBARA
G01 - MEASURING TESTING