Hidetoshi Tanaka

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Kasugai, JP

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Patents Grantslast 30 patents

Information Patent Grant
Synchronous semiconductor device, and inspection system and method...
- Patent number 7,663,392
- Issue date Feb 16, 2010
- Fujitsu Microelectronics Limited
- Hiroyuki Sugamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous semiconductor device, and inspection system and method...
- Patent number 7,378,863
- Issue date May 27, 2008
- Fujitsu Limited
- Hiroyuki Sugamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous semiconductor device, and inspection system and method...
- Patent number 6,891,393
- Issue date May 10, 2005
- Fujitsu Limited
- Hiroyuki Sugamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous semiconductor device, and inspection system and method...
- Patent number 6,559,669
- Issue date May 6, 2003
- Fujitsu Limited
- Hiroyuki Sugamoto
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYNCHRONOUS SEMICONDUCTOR DEVICE, AND INSPECTION SYSTEM AND METHOD...
- Publication number 20100052727
- Publication date Mar 4, 2010
- FUJITSU LIMITED
- Hiroyuki Sugamoto
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS SEMICONDUCTOR DEVICE, AND INSPECTION SYSTEM AND METHOD...
- Publication number 20080204067
- Publication date Aug 28, 2008
- FUJITSU LIMITED
- Hiroyuki Sugamoto
- G01 - MEASURING TESTING
Information Patent Application
Synchronous semiconductor device, and inspection system and method...
- Publication number 20050111293
- Publication date May 26, 2005
- FUJITSU LIMITED
- Hiroyuki Sugamoto
- G01 - MEASURING TESTING
Information Patent Application
Synchronous semiconductor device, and inspection system and method...
- Publication number 20030140290
- Publication date Jul 24, 2003
- FUJITSU LIMITED
- Hiroyuki Sugamoto
- G01 - MEASURING TESTING
Information Patent Application
Synchronous semiconductor device, and inspection system and method...
- Publication number 20020066058
- Publication date May 30, 2002
- FUJITSU LIMITED
- Hiroyuki Sugamoto
- G01 - MEASURING TESTING