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Hidetoshi Utsuro
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Angle measuring device and method
Patent number
7,821,626
Issue date
Oct 26, 2010
Panasonic Corporation
Takashi Urashima
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection of optical component
Patent number
7,379,172
Issue date
May 27, 2008
Matsushita Electric Industrial Co., Ltd.
Kazumasa Takata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
QUARTZ CRUCIBLE FOR GROWING SILICON SINGLE CRYSTAL, METHOD OF MANUF...
Publication number
20130276694
Publication date
Oct 24, 2013
PANASONIC CORPORATION
Hidetoshi UTSURO
C30 - CRYSTAL GROWTH
Information
Patent Application
EXTERIOR PARTS AND METHOD OF MANUFACTURING THE SAME
Publication number
20110090564
Publication date
Apr 21, 2011
PANASONIC CORPORATION
Hidetoshi Utsuro
B44 - DECORATIVE ARTS
Information
Patent Application
EXTERIOR PARTS AND METHOD OF MANUFACTURING THE SAME AND ELECTRONIC...
Publication number
20110026208
Publication date
Feb 3, 2011
PANASONIC CORPORATION
Hidetoshi Utsuro
B44 - DECORATIVE ARTS
Information
Patent Application
ANGLE MEASURING DEVICE AND METHOD
Publication number
20090231573
Publication date
Sep 17, 2009
Takashi Urashima
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for inspection of optical component
Publication number
20060192977
Publication date
Aug 31, 2006
Kazumasa Takata
G01 - MEASURING TESTING