Hidetoshi Yoshida

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
System for analyzing trace amounts of impurities in gases
- Patent number 6,418,781
- Issue date Jul 16, 2002
- Nippon Sanso Corporation
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Multi-gas analysis system for analyzing high-purity gases
- Patent number 6,324,892
- Issue date Dec 4, 2001
- Nippon Sanso Corporation
- Akira Nishina
- G01 - MEASURING TESTING