Hidetsugu Tanoue

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis apparatus and method for controlling automatic a...
- Patent number 11,499,983
- Issue date Nov 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Shunichirou Nobuki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and optical measurement method
- Patent number 11,493,430
- Issue date Nov 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 10,884,009
- Issue date Jan 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Hidetsugu Tanoue
- G01 - MEASURING TESTING
Information Patent Grant
Light amount detection device, immune analyzing apparatus and charg...
- Patent number 10,168,208
- Issue date Jan 1, 2019
- Hitachi High-Technologies Corporation
- Yutaka Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,529,009
- Issue date Dec 27, 2016
- Hitachi High-Technologies Corporation
- Hidetsugu Tanoue
- G01 - MEASURING TESTING
Information Patent Grant
Luminescence measuring apparatus
- Patent number 7,903,248
- Issue date Mar 8, 2011
- Hitachi High-Technologies Corporation
- Hidetsugu Tanoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20240183871
- Publication date Jun 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahide DENAWA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM
- Publication number 20240119698
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Analyzer and Method of Storing Reagent in Automatic Analyzer
- Publication number 20240042448
- Publication date Feb 8, 2024
- Hitachi High-Tech Corporation
- Hiroya UMEKI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20230358776
- Publication date Nov 9, 2023
- Hitachi High-Tech Corporation
- Koji HATAKEYAMA
- G01 - MEASURING TESTING
Information Patent Application
COMPUTING MACHINE, LEARNING METHOD OF CLASSIFIER, AND ANALYSIS SYSTEM
- Publication number 20230072040
- Publication date Mar 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20220196691
- Publication date Jun 23, 2022
- Hitachi High-Tech Corporation
- Eiichiro Takada
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND OPTICAL MEASUREMENT METHOD
- Publication number 20210310933
- Publication date Oct 7, 2021
- Kosuke Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Apparatus and Method for Controlling Automatic A...
- Publication number 20200319218
- Publication date Oct 8, 2020
- Hitachi High-Tech Corporation
- Shunichirou NOBUKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20200271679
- Publication date Aug 27, 2020
- Hitachi High-Technologies Corporation
- Hiroki NAKANO
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer
- Publication number 20190107549
- Publication date Apr 11, 2019
- Hitachi High-Technologies Corporation
- Hidetsugu TANOUE
- G01 - MEASURING TESTING
Information Patent Application
LIGHT AMOUNT DETECTION DEVICE, IMMUNE ANALYZING APPARATUS AND CHARG...
- Publication number 20180066986
- Publication date Mar 8, 2018
- Hitachi High-Technologies Corporation
- Yutaka KASAI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20140123774
- Publication date May 8, 2014
- Hitachi High-Technologies Corporation
- Hidetsugu Tanoue
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20130052080
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Hidetsugu Tanoue
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20110058984
- Publication date Mar 10, 2011
- Hitachi High-Technologies Corporation
- Takahiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20090022626
- Publication date Jan 22, 2009
- Hidetsugu TANOUE
- G01 - MEASURING TESTING
Information Patent Application
LUMINESCENCE MEASURING APPARATUS
- Publication number 20080225279
- Publication date Sep 18, 2008
- Hidetsugu TANOUE
- G01 - MEASURING TESTING

Hidetsugu Tanoue

Person

Patents Grantslast 30 patents

Automatic analysis apparatus and method for controlling automatic a...

Automatic analyzer and optical measurement method

Automated analyzer

Light amount detection device, immune analyzing apparatus and charg...

Automatic analyzer

Luminescence measuring apparatus

Patents Applicationslast 30 patents

AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD

IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM

Automatic Analyzer and Method of Storing Reagent in Automatic Analyzer

Automatic Analyzer

COMPUTING MACHINE, LEARNING METHOD OF CLASSIFIER, AND ANALYSIS SYSTEM

AUTOMATIC ANALYZER

AUTOMATIC ANALYZER AND OPTICAL MEASUREMENT METHOD

Automatic Analysis Apparatus and Method for Controlling Automatic A...

AUTOMATIC ANALYZER

Automated Analyzer

LIGHT AMOUNT DETECTION DEVICE, IMMUNE ANALYZING APPARATUS AND CHARG...

AUTOMATIC ANALYZER

AUTOMATIC ANALYZER

AUTOMATIC ANALYZER

AUTOMATED ANALYZER

LUMINESCENCE MEASURING APPARATUS