Hideya TOMITA

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Patents Grantslast 30 patents

Information Patent Grant
Control apparatus and control method having a slit selection based...
- Patent number 9,404,798
- Issue date Aug 2, 2016
- NEC Corporation
- Hideya Tomita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTROL APPARATUS AND CONTROL METHOD
- Publication number 20150144766
- Publication date May 28, 2015
- NEC Corporation
- Hideya TOMITA
- G01 - MEASURING TESTING