Hideyasu CHIBA

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device
- Patent number 10,073,111
- Issue date Sep 11, 2018
- Hitachi High-Technologies Corporation
- Takeshi Setomaru
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 9,689,883
- Issue date Jun 27, 2017
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 9,575,085
- Issue date Feb 21, 2017
- Hitachi High-Technologies Corporation
- Takeshi Setomaru
- G01 - MEASURING TESTING
Information Patent Grant
Biochemical analyzer
- Patent number D729399
- Issue date May 12, 2015
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Biochemical analyzer
- Patent number D721820
- Issue date Jan 27, 2015
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Cover of a biochemical analyzer
- Patent number D720079
- Issue date Dec 23, 2014
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D24 - Medical and laboratory equipment
Information Patent Grant
Automatic analyzer
- Patent number 8,182,745
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Hideyasu Chiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic Analysis Device
- Publication number 20170153259
- Publication date Jun 1, 2017
- Hitachi High-Technologies Corproation
- Takeshi SETOMARU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20160195563
- Publication date Jul 7, 2016
- Hitachi High-Technologies Corporation
- Mitsuru OONUMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20160195562
- Publication date Jul 7, 2016
- Hitachi High-Technologies Corporation
- Mitsuru OONUMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20150346230
- Publication date Dec 3, 2015
- Hitachi High-Technologies Corporation
- Takeshi SETOMARU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20090068063
- Publication date Mar 12, 2009
- Hideyasu CHIBA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL