Hideyo YAMASHIRO

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature detection circuit
- Patent number 12,152,946
- Issue date Nov 26, 2024
- Murata Manufacturing Co., Ltd.
- Nobukazu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Bias circuit
- Patent number 11,863,129
- Issue date Jan 2, 2024
- Murata Manufacturing Co., Ltd.
- Hideyo Yamashiro
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Bias circuit and electronic circuit
- Patent number 11,558,049
- Issue date Jan 17, 2023
- Murata Manufacturing Co., Ltd.
- Hideyo Yamashiro
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature detection circuit, power amplification circuit, and ele...
- Patent number 11,177,777
- Issue date Nov 16, 2021
- Murata Manufacturing Co., Ltd.
- Hideyo Yamashiro
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BIAS CIRCUIT
- Publication number 20210367561
- Publication date Nov 25, 2021
- MURATA MANUFACTURING CO., LTD.
- Hideyo YAMASHIRO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE DETECTION CIRCUIT
- Publication number 20210310878
- Publication date Oct 7, 2021
- MURATA MANUFACTURING CO., LTD.
- Nobukazu SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
BIAS CIRCUIT AND ELECTRONIC CIRCUIT
- Publication number 20210218395
- Publication date Jul 15, 2021
- MURATA MANUFACTURING CO., LTD.
- Hideyo YAMASHIRO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE DETECTION CIRCUIT, POWER AMPLIFICATION CIRCUIT, AND ELE...
- Publication number 20200212850
- Publication date Jul 2, 2020
- MURATA MANUFACTURING CO., LTD.
- Hideyo YAMASHIRO
- G05 - CONTROLLING REGULATING