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Hideyuki ARAI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Shape measuring method
    • Patent number 11,530,914
    • Issue date Dec 20, 2022
    • Mitutoyo Corporation
    • Lukasz Redlarski
    • G02 - OPTICS
  • Information Patent Grant

    Measuring head
    • Patent number 10,551,184
    • Issue date Feb 4, 2020
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement probe and measuring device
    • Patent number 10,415,947
    • Issue date Sep 17, 2019
    • Mitutoyo Corporation
    • Hideyuki Arai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe measuring force adjuster
    • Patent number 10,113,931
    • Issue date Oct 30, 2018
    • Mitutoyo Corporation
    • Hideyuki Arai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Time measurement device
    • Patent number 9,563,176
    • Issue date Feb 7, 2017
    • Seiko Epson Corporation
    • Takashi Kawaguchi
    • G04 - HOROLOGY
  • Information Patent Grant

    Analog electronic timepiece
    • Patent number 9,354,610
    • Issue date May 31, 2016
    • Seiko Epson Corporation
    • Makoto Okeya
    • G04 - HOROLOGY
  • Information Patent Grant

    Alarm clock
    • Patent number 5,966,346
    • Issue date Oct 12, 1999
    • Casio Computer Co., Ltd.
    • Hideyuki Arai
    • G04 - HOROLOGY

Patents Applicationslast 30 patents

  • Information Patent Application

    SHAPE MEASURING METHOD
    • Publication number 20220034650
    • Publication date Feb 3, 2022
    • MITUTOYO CORPORATION
    • Lukasz REDLARSKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING HEAD
    • Publication number 20180274914
    • Publication date Sep 27, 2018
    • MITUTOYO CORPORATION
    • Sadayuki MATSUMIYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT PROBE AND MEASURING DEVICE
    • Publication number 20180023936
    • Publication date Jan 25, 2018
    • MITUTOYO CORPORATION
    • Hideyuki ARAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MEASURING FORCE ADJUSTER
    • Publication number 20160299028
    • Publication date Oct 13, 2016
    • MITUTOYO CORPORATION
    • Hideyuki ARAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALOG ELECTRONIC TIMEPIECE
    • Publication number 20150309477
    • Publication date Oct 29, 2015
    • SEIKO EPSON CORPORATION
    • Makoto OKEYA
    • G04 - HOROLOGY
  • Information Patent Application

    TIME MEASUREMENT DEVICE
    • Publication number 20150309479
    • Publication date Oct 29, 2015
    • SEIKO EPSON CORPORATION
    • Takashi KAWAGUCHI
    • G04 - HOROLOGY