Hideyuki Hanafusa

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Takamatsu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for displaying defect in central area of monitor
- Patent number 5,377,279
- Issue date Dec 27, 1994
- Futec Inc.
- Hideyuki Hanafusa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detection of surface defects of hot metal...
- Patent number 4,759,072
- Issue date Jul 19, 1988
- Kawasaki Steel Corp.
- Hirosato Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining the surface of a continuously cast metal strip...
- Patent number 4,237,959
- Issue date Dec 9, 1980
- Futec Inc.
- Tomio Yamamoto
- G01 - MEASURING TESTING