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Hideyuki Higuchi
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Clinical specimen processing apparatus and clinical specimen proces...
Patent number
9,110,042
Issue date
Aug 18, 2015
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Grant
Specimen preparation apparatus, specimen preparation/analysis syste...
Patent number
8,309,027
Issue date
Nov 13, 2012
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Grant
Specimen preparation apparatus, specimen preparation/analysis syste...
Patent number
8,221,683
Issue date
Jul 17, 2012
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Grant
Clinical specimen processing apparatus
Patent number
7,951,330
Issue date
May 31, 2011
Sysmex Corporation
Mizuho Nishikiori
G01 - MEASURING TESTING
Information
Patent Grant
Sample imaging apparatus, sample analyzing apparatus, and sample im...
Patent number
7,936,912
Issue date
May 3, 2011
Sysmex Corporation
Ryuichi Tohma
G01 - MEASURING TESTING
Information
Patent Grant
Sample preparing apparatus
Patent number
7,833,485
Issue date
Nov 16, 2010
SYSMEX CORPORATION
Hideyuki Higuchi
G01 - MEASURING TESTING
Information
Patent Grant
Clinical specimen processing apparatus and clinical specimen proces...
Patent number
7,776,271
Issue date
Aug 17, 2010
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECIMEN PREPARATION APPARATUS, SPECIMEN PREPARATION/ANALYSIS SYSTE...
Publication number
20120267440
Publication date
Oct 25, 2012
SYSMEX CORPORATION
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Application
CLINICAL SPECIMEN PROCESSING APPARATUS AND CLINICAL SPECIMEN PROCES...
Publication number
20100290950
Publication date
Nov 18, 2010
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN PREPARATION APPARATUS, SPECIMEN PREPARATION/ANALYSIS SYSTE...
Publication number
20100178695
Publication date
Jul 15, 2010
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Application
Sample imaging apparatus, sample analyzing apparatus, and sample im...
Publication number
20070077550
Publication date
Apr 5, 2007
Sysmex Corporation
Ryuichi Tohma
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sample preparing apparatus
Publication number
20060051241
Publication date
Mar 9, 2006
Hideyuki Higuchi
G01 - MEASURING TESTING
Information
Patent Application
Specimen preparation apparatus, specimen preparation/analysis syste...
Publication number
20060029519
Publication date
Feb 9, 2006
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Application
Clinical specimen processing apparatus
Publication number
20060024200
Publication date
Feb 2, 2006
Mizuho Nishikiori
G01 - MEASURING TESTING
Information
Patent Application
Clinical specimen processing apparatus and clinical specimen proces...
Publication number
20050281707
Publication date
Dec 22, 2005
Sysmex Corporation
Masanori Nakaya
G01 - MEASURING TESTING
Information
Patent Application
Clinical specimen processing apparatus and clinical specimen proces...
Publication number
20050254999
Publication date
Nov 17, 2005
Sysmex Corporation
Hideyuki Higuchi
G06 - COMPUTING CALCULATING COUNTING