Hideyuki Ichihara

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Hiroshima-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect detecting device, image sensor device, image sensor module,...
- Patent number 7,783,103
- Issue date Aug 24, 2010
- Sharp Kabushiki Kaisha
- Toshimasa Kuchii
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic circuit test apparatus and logic circuit test method
- Patent number 7,043,675
- Issue date May 9, 2006
- Sharp Kabushiki Kaisha
- Koji Isodono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect detecting device, image sensor device, image sensor module,...
- Publication number 20070071304
- Publication date Mar 29, 2007
- Sharp Kabushiki Kaisha
- Toshimasa Kuchii
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic circuit test apparatus and logic circuit test method
- Publication number 20040093542
- Publication date May 13, 2004
- Sharp Kabushiki Kaisha
- Koji Isodono
- G01 - MEASURING TESTING