Hideyuki Kitazono

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting and testing startup range neutron monitori...
- Patent number 8,442,181
- Issue date May 14, 2013
- Kabushiki Kaisha Toshiba
- Hideyuki Kitazono
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus for inspecting and testing startup range neutron monitori...
- Patent number 8,116,421
- Issue date Feb 14, 2012
- Kabushiki Kaisha Toshiba
- Hideyuki Kitazono
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Safety protection instrumentation system and method of operating th...
- Patent number 7,774,187
- Issue date Aug 10, 2010
- Kabushiki Kaisha Toshiba
- Mikio Izumi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for verifying custom IC
- Patent number 7,669,090
- Issue date Feb 23, 2010
- Kabushiki Kaisha Toshiba
- Hideyuki Kitazono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION MONITORING SYSTEM, METHOD, AND PROGRAM
- Publication number 20150346357
- Publication date Dec 3, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hirotaka SAKAI
- G01 - MEASURING TESTING
Information Patent Application
NEUTRON FLUX LEVEL MEASUREMENT SYSTEM, NEUTRON FLUX LEVEL COMPUTING...
- Publication number 20150348656
- Publication date Dec 3, 2015
- KABUSHIKI KAISHA TOSHIBA
- Shigehiro KONO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
APPARATUS FOR INSPECTING AND TESTING STARTUP RANGE NEUTRON MONITORI...
- Publication number 20120121054
- Publication date May 17, 2012
- Kabushiki Kaisha Toshiba
- Hideyuki Kitazono
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
APPARATUS FOR INSPECTING AND TESTING STARTUP RANGE NEUTRON MONITORI...
- Publication number 20090003506
- Publication date Jan 1, 2009
- Kabushiki Kaisha Toshiba
- Hideyuki Kitazono
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
APPARATUS AND METHOD FOR VERIFYING CUSTOM IC
- Publication number 20070271489
- Publication date Nov 22, 2007
- KABUSHIKI KAISHA TOSHIBA
- Hideyuki Kitazono
- G01 - MEASURING TESTING
Information Patent Application
Safety protective instrumentation system and its handling method
- Publication number 20070185700
- Publication date Aug 9, 2007
- KABUSHIKI KAISHA TOBHIBA
- Mikio Izumi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Hideyuki Kitazono

Person

Patents Grantslast 30 patents

Apparatus for inspecting and testing startup range neutron monitori...

Apparatus for inspecting and testing startup range neutron monitori...

Safety protection instrumentation system and method of operating th...

Apparatus and method for verifying custom IC

Patents Applicationslast 30 patents

RADIATION MONITORING SYSTEM, METHOD, AND PROGRAM

NEUTRON FLUX LEVEL MEASUREMENT SYSTEM, NEUTRON FLUX LEVEL COMPUTING...

APPARATUS FOR INSPECTING AND TESTING STARTUP RANGE NEUTRON MONITORI...

APPARATUS FOR INSPECTING AND TESTING STARTUP RANGE NEUTRON MONITORI...

APPARATUS AND METHOD FOR VERIFYING CUSTOM IC

Safety protective instrumentation system and its handling method