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Hideyuki Kurokawa
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Touyo-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for analyzing sample solution and apparatus for analyzing sa...
Patent number
8,481,330
Issue date
Jul 9, 2013
Panasonic Corporation
Yoko Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Chromatography inspection apparatus and method for judging degradat...
Patent number
8,447,084
Issue date
May 21, 2013
Panasonic Corporation
Masahiro Aga
G01 - MEASURING TESTING
Information
Patent Grant
Liquid sample analyzing method
Patent number
8,345,249
Issue date
Jan 1, 2013
Panasonic Corporation
Hideyuki Kurokawa
G01 - MEASURING TESTING
Information
Patent Grant
Liquid sample analysis device
Patent number
8,323,566
Issue date
Dec 4, 2012
Panasonic Corporation
Kenji Murakami
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing device and analyzing method
Patent number
8,310,678
Issue date
Nov 13, 2012
Panasonic Corporation
Ryosuke Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Particulate determination method
Patent number
7,974,790
Issue date
Jul 5, 2011
Panasonic Corporation
Junji Tada
G01 - MEASURING TESTING
Information
Patent Grant
Particulates detection method
Patent number
7,516,020
Issue date
Apr 7, 2009
Panasonic Corporation
Junji Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Particulate determination method
Patent number
7,430,480
Issue date
Sep 30, 2008
Matsushita Electric Industrial Co., Ltd.
Junji Tada
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
LIQUID SAMPLE ANALYSIS DEVICE
Publication number
20110129909
Publication date
Jun 2, 2011
PANASONIC CORPORATION
Kenji Murakami
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING SAMPLE SOLUTION AND APPARATUS FOR ANALYZING SA...
Publication number
20110053291
Publication date
Mar 3, 2011
PANASONIC CORPORATION
Yoko Matsuda
G01 - MEASURING TESTING
Information
Patent Application
LIQUID SAMPLE ANALYZING METHOD
Publication number
20110032525
Publication date
Feb 10, 2011
PANASONIC CORPORATION
Hideyuki Kurokawa
G01 - MEASURING TESTING
Information
Patent Application
ANALYZING DEVICE AND ANALYZING METHOD
Publication number
20100290051
Publication date
Nov 18, 2010
PANASONIC CORPORATION
Ryosuke Yamada
G01 - MEASURING TESTING
Information
Patent Application
SOLUTION MEASUREMENT METHOD AND SOLUTION MEASUREMENT APPARATUS
Publication number
20100273271
Publication date
Oct 28, 2010
PANASONIC CORPORATON
Takahiko Tanida
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPHY INSPECTION APPARATUS AND METHOD FOR JUDGING DEGRADAT...
Publication number
20100260411
Publication date
Oct 14, 2010
PANASONIC CORPORATION
Masahiro Aga
G01 - MEASURING TESTING
Information
Patent Application
MEASURING METHOD USING BIOSENSOR
Publication number
20100210028
Publication date
Aug 19, 2010
PANASONIC CORPORATION
Koji Miyoshi
G01 - MEASURING TESTING
Information
Patent Application
PARTICULATE DETERMINATION METHOD
Publication number
20080262749
Publication date
Oct 23, 2008
Junji Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Particulates detection method
Publication number
20070174018
Publication date
Jul 26, 2007
Junji Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Particulate determination method
Publication number
20050128480
Publication date
Jun 16, 2005
Junji Tada
G06 - COMPUTING CALCULATING COUNTING