Hideyuki Nakamura

Person

  • Kanagawa, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    APPARATUS AND METHOD FOR QUANTITATIVE EVALUATION OF BRAZE BONDING L...

    • Publication number 20160265909
    • Publication date Sep 15, 2016
    • KABUSHIKI KAISHA TOSHIBA
    • Ryosuke OHIRABARU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE

    • Publication number 20100320570
    • Publication date Dec 23, 2010
    • NEC Electronics Corporation
    • Hideyuki Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE

    • Publication number 20100084689
    • Publication date Apr 8, 2010
    • NEC ELECTRONICS CORPORATION
    • Hideyuki Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Latch circuit tolerant to single event transient

    • Publication number 20070268056
    • Publication date Nov 22, 2007
    • NEC Electronics Corporation
    • Hideyuki Nakamura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Semiconductor integrated circuit

    • Publication number 20060215441
    • Publication date Sep 28, 2006
    • NEC Electronics Corporation
    • Muneaki Matsushige
    • G11 - INFORMATION STORAGE