Hideyuki Norimatsu

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
System for measuring low current with contact making and breaking d...
- Patent number 5,929,626
- Issue date Jul 27, 1999
- Hewlett-Packard Company
- Yuko Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Contact making and breaking device and system for measuring low cur...
- Patent number 5,742,216
- Issue date Apr 21, 1998
- Hewlett-Packard Company
- Yuko Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Reed relay and switch matrix device using the same
- Patent number 5,252,936
- Issue date Oct 12, 1993
- Hewlett-Packard Company
- Hideyuki Norimatsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for inspecting array substrate
- Publication number 20060125512
- Publication date Jun 15, 2006
- AGILENT TECHNOLOGIES, INC.
- Nobutaka Itagaki
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
System for manufacturing display panel, method to be used in same,...
- Publication number 20060028231
- Publication date Feb 9, 2006
- AGILENT TECHNOLOGIES, INC.
- Akito Kishida
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS