Hideyuki Ohtake

Person

Kariya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Film thickness measuring device and film thickness measuring method
- Patent number 9,841,272
- Issue date Dec 12, 2017
- Toyota Jidosha Kabushiki Kaisha
- Jun Takayanagi
- G01 - MEASURING TESTING
Information Patent Grant
Coating film inspection apparatus and inspection method
- Patent number 8,513,608
- Issue date Aug 20, 2013
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave generation device and method for generating terahert...
- Patent number 8,497,490
- Issue date Jul 30, 2013
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G02 - OPTICS
Information Patent Grant
Device and method for measuring thickness of paint film in non-cont...
- Patent number 8,450,689
- Issue date May 28, 2013
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for configuration examination
- Patent number 7,593,099
- Issue date Sep 22, 2009
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Reflection type terahertz spectrometer and spectrometric method
- Patent number 7,488,940
- Issue date Feb 10, 2009
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Electric-field distribution measurement method and apparatus for se...
- Patent number 7,466,151
- Issue date Dec 16, 2008
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channeled measuring method and apparatus for measuring spectr...
- Patent number 7,221,451
- Issue date May 22, 2007
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor crystal for generating terahertz waves, terahertz wav...
- Patent number 7,177,071
- Issue date Feb 13, 2007
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20160069673
- Publication date Mar 10, 2016
- Toyota Jidosha Kabushiki Kaisha
- Jun TAKAYANAGI
- G01 - MEASURING TESTING
Information Patent Application
COATING FILM INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120326037
- Publication date Dec 27, 2012
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE GENERATION DEVICE AND METHOD FOR GENERATING TERAHERT...
- Publication number 20110147621
- Publication date Jun 23, 2011
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G02 - OPTICS
Information Patent Application
DEVICE FOR MEASURING THICKNESS OF PAINT FILM IN NON-CONTACTING MANNER
- Publication number 20100195090
- Publication date Aug 5, 2010
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT FILM THICKNESS MEASUREMENT METHOD AND DEVICE
- Publication number 20100195092
- Publication date Aug 5, 2010
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING THICKNESS OF PAINT FILM IN NON-CONT...
- Publication number 20100149520
- Publication date Jun 17, 2010
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki OHTAKE
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE GENERATING APPARATUS AND TERAHERTZ WAVE GENERATING M...
- Publication number 20100054296
- Publication date Mar 4, 2010
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki OHTAKE
- G02 - OPTICS
Information Patent Application
METHOD AND DEVICE FOR CONFIGURATION EXAMINATION
- Publication number 20080084554
- Publication date Apr 10, 2008
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring electric field distribution of semi...
- Publication number 20070018634
- Publication date Jan 25, 2007
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Reflection type terahertz spectrometer and spectrometric method
- Publication number 20060231762
- Publication date Oct 19, 2006
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor crystal for generating terahertz waves, terahertz wav...
- Publication number 20050258368
- Publication date Nov 24, 2005
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G02 - OPTICS
Information Patent Application
Multi-channeled measuring method and apparatus for measuring spectr...
- Publication number 20050179905
- Publication date Aug 18, 2005
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING

Hideyuki Ohtake

Person

Patents Grantslast 30 patents

Film thickness measuring device and film thickness measuring method

Coating film inspection apparatus and inspection method

Terahertz wave generation device and method for generating terahert...

Device and method for measuring thickness of paint film in non-cont...

Method and device for configuration examination

Reflection type terahertz spectrometer and spectrometric method

Electric-field distribution measurement method and apparatus for se...

Multi-channeled measuring method and apparatus for measuring spectr...

Semiconductor crystal for generating terahertz waves, terahertz wav...

Patents Applicationslast 30 patents

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

COATING FILM INSPECTION APPARATUS AND INSPECTION METHOD

TERAHERTZ WAVE GENERATION DEVICE AND METHOD FOR GENERATING TERAHERT...

DEVICE FOR MEASURING THICKNESS OF PAINT FILM IN NON-CONTACTING MANNER

NONCONTACT FILM THICKNESS MEASUREMENT METHOD AND DEVICE

DEVICE AND METHOD FOR MEASURING THICKNESS OF PAINT FILM IN NON-CONT...

TERAHERTZ WAVE GENERATING APPARATUS AND TERAHERTZ WAVE GENERATING M...

METHOD AND DEVICE FOR CONFIGURATION EXAMINATION

Method and device for measuring electric field distribution of semi...

Reflection type terahertz spectrometer and spectrometric method

Semiconductor crystal for generating terahertz waves, terahertz wav...

Multi-channeled measuring method and apparatus for measuring spectr...