Hideyuki Okamoto

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Foreign matter inspection apparatus
- Patent number 8,395,766
- Issue date Mar 12, 2013
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus
- Patent number 7,898,653
- Issue date Mar 1, 2011
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS
- Publication number 20110109901
- Publication date May 12, 2011
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection apparatus
- Publication number 20080151234
- Publication date Jun 26, 2008
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING