Hideyuki SUNAGA

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Wako-shi, Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Target structure and target device
- Patent number 11,985,755
- Issue date May 14, 2024
- Riken
- Tomohiro Kobayashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Nondestructive test system comprising a neutron emission unit for e...
- Patent number 11,754,516
- Issue date Sep 12, 2023
- Topcon Corporation
- Hisashi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
- Patent number 11,747,288
- Issue date Sep 5, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive testing system and nondestructive testing method
- Patent number 11,614,415
- Issue date Mar 28, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection method
- Patent number 11,609,190
- Issue date Mar 21, 2023
- Topcon Corporation
- Yuichi Yoshimura
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspecting system, and nondestructive inspecting method
- Patent number 11,513,084
- Issue date Nov 29, 2022
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NONDESTRUCTIVE TEST SYSTEM AND NONDESTRUCTIVE TEST METHOD
- Publication number 20220128489
- Publication date Apr 28, 2022
- TOPCON CORPORATION
- Hisashi TSUKADA
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD
- Publication number 20220082514
- Publication date Mar 17, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20220003690
- Publication date Jan 6, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...
- Publication number 20210396688
- Publication date Dec 23, 2021
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
TARGET STRUCTURE AND TARGET DEVICE
- Publication number 20210168925
- Publication date Jun 3, 2021
- Riken
- Tomohiro KOBAYASHI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NON-DESTRUCTIVE INSPECTION METHOD
- Publication number 20210131981
- Publication date May 6, 2021
- TOPCON CORPORATION
- Yuichi YOSHIMURA
- G01 - MEASURING TESTING