TREA

Hideyuki Suzawa

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Data latch circuit
    • Patent number 8,704,573
    • Issue date Apr 22, 2014
    • Advantest Corporation
    • Hideyuki Suzawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sequence control apparatus and test apparatus
    • Patent number 8,280,529
    • Issue date Oct 2, 2012
    • Advantest Corporation
    • Hideyuki Suzawa
    • G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

  • Information Patent Application

    DATA LATCH CIRCUIT
    • Publication number 20110285443
    • Publication date Nov 24, 2011
    • Advantest Corporation
    • Hideyuki Suzawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEQUENCE CONTROL APPARATUS AND TEST APPARATUS
    • Publication number 20100211193
    • Publication date Aug 19, 2010
    • Advantest Corporation
    • Hideyuki SUZAWA
    • G05 - CONTROLLING REGULATING