Hideyuki Wakai

Person

Hiratsuka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Work instruction system and conveyance control system in production...
- Patent number 5,793,638
- Issue date Aug 11, 1998
- Kabushiki Kaisha Komatsu Seisakusho
- Yoshihiro Yao
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Confocal optical apparatus
- Patent number 5,659,420
- Issue date Aug 19, 1997
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G02 - OPTICS
Information Patent Grant
Three-dimensional image measuring device
- Patent number 5,629,773
- Issue date May 13, 1997
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional image measuring device
- Patent number 5,568,261
- Issue date Oct 22, 1996
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
three-dimensional image measuring device
- Patent number 5,559,603
- Issue date Sep 24, 1996
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional image display device
- Patent number 5,506,703
- Issue date Apr 9, 1996
- Kabushiki Kaisha Komatsu Seisakusho
- Toru Suzuki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional image measuring device
- Patent number 5,448,360
- Issue date Sep 5, 1995
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional image display device
- Patent number 5,430,560
- Issue date Jul 4, 1995
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G02 - OPTICS
Information Patent Grant
Method and device for detecting tool abnormality in machine tools
- Patent number 4,456,960
- Issue date Jun 26, 1984
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Cutting tool retreat and return for workpiece protection upon abnor...
- Patent number 4,442,493
- Issue date Apr 10, 1984
- Kabushiki Kaisha Komatsu Seisakusho
- Hideyuki Wakai
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Wafer temperature measuring method and apparatus
- Publication number 20070009010
- Publication date Jan 11, 2007
- Koji Shio
- G01 - MEASURING TESTING

Hideyuki Wakai

Person

Patents Grantslast 30 patents

Work instruction system and conveyance control system in production...

Confocal optical apparatus

Three-dimensional image measuring device

Three-dimensional image measuring device

three-dimensional image measuring device

Three-dimensional image display device

Three-dimensional image measuring device

Three-dimensional image display device

Method and device for detecting tool abnormality in machine tools

Cutting tool retreat and return for workpiece protection upon abnor...

Patents Applicationslast 30 patents

Wafer temperature measuring method and apparatus