Hideyuki YANAMI

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
- Patent number 10,309,979
- Issue date Jun 4, 2019
- Hitachi High-Technologies Corporation
- Hideyuki Yanami
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
- Patent number 9,817,013
- Issue date Nov 14, 2017
- Hitachi High-Technologies Corporation
- Hideyuki Yanami
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer and maintenance method for same
- Patent number 9,316,662
- Issue date Apr 19, 2016
- Hitachi High-Technologies Corporation
- Ryohei Ishigami
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
- Patent number 8,691,148
- Issue date Apr 8, 2014
- Hitachi High-Technologies Corporation
- Hideyuki Yanami
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
- Patent number 8,197,754
- Issue date Jun 12, 2012
- Hitachi High-Technologies Corporation
- Hideyuki Yanami
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
- Patent number 7,824,915
- Issue date Nov 2, 2010
- Hitachi, Ltd.
- Hideyuki Yanami
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 7,776,264
- Issue date Aug 17, 2010
- Hitachi High-Technologies Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and part feeding device used for the analyzer
- Patent number 7,360,984
- Issue date Apr 22, 2008
- Roche Diagnostics Corp.
- Hidetoshi Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 6,890,761
- Issue date May 10, 2005
- Hitachi, Ltd.
- Masato Ishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis system
- Patent number 6,019,945
- Issue date Feb 1, 2000
- Hitachi Ltd.
- Tadashi Ohishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
- Publication number 20180038882
- Publication date Feb 8, 2018
- Hitachi High-Technologies Corporation
- Hideyuki YANAMI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER AND MAINTENANCE METHOD FOR SAME
- Publication number 20140202828
- Publication date Jul 24, 2014
- Hitachi High-Technologies Corporation
- Ryohei Ishigami
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
- Publication number 20140170022
- Publication date Jun 19, 2014
- Hitachi High-Technologies Corporation
- Hideyuki YANAMI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
- Publication number 20120230873
- Publication date Sep 13, 2012
- Hitachi High-Technologies Corporation
- Hideyuki YANAMI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
- Publication number 20110014085
- Publication date Jan 20, 2011
- Hitachi, Ltd
- Hideyuki Yanami
- G01 - MEASURING TESTING
Information Patent Application
Automatic analyzer
- Publication number 20050175503
- Publication date Aug 11, 2005
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Application
Sample dispensing apparatus and automatic analyzer including the same
- Publication number 20040245275
- Publication date Dec 9, 2004
- Hideyuki Yanami
- G01 - MEASURING TESTING
Information Patent Application
Automatic analyzer
- Publication number 20020064481
- Publication date May 30, 2002
- Masato Ishizawa
- G01 - MEASURING TESTING

Hideyuki YANAMI

Person

Patents Grantslast 30 patents

Sample dispensing apparatus and automatic analyzer including the same

Sample dispensing apparatus and automatic analyzer including the same

Automated analyzer and maintenance method for same

Sample dispensing apparatus and automatic analyzer including the same

Sample dispensing apparatus and automatic analyzer including the same

Sample dispensing apparatus and automatic analyzer including the same

Automatic analyzer

Automatic analyzer and part feeding device used for the analyzer

Automatic analyzer

Sample analysis system

Patents Applicationslast 30 patents

SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

AUTOMATED ANALYZER AND MAINTENANCE METHOD FOR SAME

SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

Automatic analyzer

Sample dispensing apparatus and automatic analyzer including the same

Automatic analyzer