Hidong KWAK

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Suwon-si, KR

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Patents Applicationslast 30 patents

Information Patent Application
OPTICAL IMAGING DEVICE
- Publication number 20250027875
- Publication date Jan 23, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo Lee
- G01 - MEASURING TESTING
Information Patent Application
WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...
- Publication number 20240353350
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Kihong CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20240077424
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- Hyunwoo RYOO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MEASUREMENT METHOD USING X-RAY SCATTERING AND...
- Publication number 20230380783
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Jaeyong LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE